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  1. No Access

    Article

    Structural investigations of pulsed laser-deposited NiO epitaxial layers under different fluence values

    The epitaxial NiO layers deposited with higher fluence values are found to be strained, and the strain increases with the fluence values. The X-ray diffraction (XRD) profile taken from the synchrotron beam sho...

    S. D. Singh, Nirmalendu Patra, M. N. Singh, C. Mukherjee… in Journal of Materials Science (2019)

  2. No Access

    Article

    Studies on ω Phase Formation in Ti-Mo Alloys Using Synchrotron XRD

    This paper presents the results of synchrotron based x-ray diffraction experiments in Ti-Mo alloys, to examine the formation of metastable ω phase, which could not be detected using conventional XRD (x-ray dif...

    M. Sabeena, S. Murugesan, R. Mythili… in Transactions of the Indian Institute of Me… (2015)