Skip to main content

1 Result(s)

within M. Jaouen Remove this filter Physics Remove this filter

and

  1. No Access

    Article

    Thermal Conductivity Measurements of Thin Amorphous Silicon Films by Scanning Thermal Microscopy

    Thermal conductivity measurements of thin amorphous silicon films performed with a micro-thermistance mounted on an atomic force microscope are presented. A specific thermal model is implemented, and an identi...

    S. Volz, X. Feng, C. Fuentes, P. Guérin… in International Journal of Thermophysics (2002)