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    Investigation of Amorphous InGaZnO Based TFT Interface Properties with Synchrotron Radiation Analysis

    We investigated the amorphous indium gallium zinc oxide (IGZO) based TFT interface properties using synchrotron radiation analysis. Near edge x-ray absorption fine structure shows the presence of N2 molecules bet...

    Minho Joo, Jongkwon Choi, Seokhwan Noh, Kyuho Park… in MRS Online Proceedings Library (2008)