Skip to main content

12 Result(s)

within J Halbritter Remove this filter Nanotechnology Remove this filter

and

  1. No Access

    Article

    Corrosion and surface spectroscopies of high-temperature superconductors

    Crucial spectroscopic high-temperature superconductor (HTS) information is based on surface methods, like scanning tunneling spectroscopy (STS) or angle-resolved photo-emission spectroscopy (ARPES). But, typic...

    P. Henzi, D. Schild, J. Halbritter in Applied Physics A (2001)

  2. No Access

    Article

    Charge transfer via interfaces, especially of nanoscale materials

    J. Halbritter in Applied Physics A (1999)

  3. No Access

    Article

    Tunnel channels, spectroscopy and imaging in STM

    φ/?≈5.1/nmfor a tunnel with barrier height φ≈1 eV are given for surfaces covered by water, air or vacuum. Despite the n=1,2,3 intermediate states and their charging, imaging down to atomic resolution is achiev...

    J. Halbritter in Applied Physics A (1998)

  4. No Access

    Article

    YBa2Cu3O7-δ single crystals revisited: Scanning probe data on very pure samples grown in BaZrO3 crucibles

    Cu3O7-δ (YBCO) single crystals grown in BaZrO3 crucibles by scanning and friction force microscopy (SFM, FFM) as well as by scanning tunneling microscopy (STM) and angle resolved X-ray photo-electron spectroscopy...

    U. Hubler, P. Jess, H.P. Lang, A. Erb, E. Walker, M. Regier, D. Schild… in Applied Physics A (1998)

  5. No Access

    Article

    Nucleation and growth of Ni-LIGA layers

     The quality of a Ni-LIGA layer and its adhesion to TiO2 depend crucially on interface morphology and chemistry. The unique combination of ARXPS (angle resolved photo electron spectroscopy), STM (Scanning tunnel ...

    M. Strobel, U. Schmidt, K. Bade, J. Halbritter in Microsystem Technologies (1996)

  6. No Access

    Article

    ARXPS studies of SiO2-SiC interfaces and oxidation of 6H SiC single crystal Si-(001) and C-(001) surfaces

    The main puzzle in oxidation of hexagonal SiC is the slower rate of the Si-terminated surface as compared to the C-terminated surface, which is blamed on an unknown interface compound. ARXPS is a unique method...

    B. Hornetz, H-J. Michel, J. Halbritter in Journal of Materials Research (1994)

  7. No Access

    Article

    Effect of the Weak Links on the Surface Resistance of YBa2Cu3Ox Bulk Material

    Dc magnetic field, temperature, and magnetic history dependencies of the millimeter-wave surface resistance have been measured in high quality grain-aligned and in polycrystalline YBa2Cu3Ox bulk material. The mea...

    J. Wosik, L. M. **e, J. Halbritter, R. Chau, A. Samaan… in MRS Online Proceedings Library (1992)

  8. No Access

    Article

    On Extrinsic Effects in the Surface Impedance of Cuprate Superconductors

    Presently, the rf surface impedance Z of cuprate superconductors is still shrinking with material improvements, which is shown clearly by Z = Z1+Zres still dominated by extrinsic properties summarized in Zres. We...

    J. Halbritter in MRS Online Proceedings Library (1992)

  9. No Access

    Article

    Surface Impedance and Granularity in Superconducting Cuprates

    The rf residual surface resistance Rres is an important figure of merit for superconducting microwave devices and for establishing the homogeneity of superconducting surfaces. In granular superconductors not only...

    J. Halbritter in MRS Online Proceedings Library (1990)

  10. No Access

    Article

    Model of Si–SiO2 interfaces based on ARXPS measurements

    Angle-resolved x-ray photoelectron spectroscopy (ARXPS) results in a very detailed analysis of minor amounts (≥0.3 nm) of interface compounds and their spatial distribution. First experimental results on the S...

    J. Halbritter in Journal of Materials Research (1988)

  11. No Access

    Article

    On the oxidation and on the superconductivity of niobium

    Most superconducting rf cavities consist on Nb and most Josephson tunnel junctions are Nb based. Due to the very small dissipation in these superconducting cavities and tunnel junctions quantitative and qualit...

    J. Halbritter in Applied Physics A (1987)

  12. No Access

    Article

    Dynamical enhanced electron emission and discharges at contaminated surfaces

    Broad-area electrodes show electron emission already at electric field strengthsF≈107 V/m. This enhanced field emission (EFE) occurs only for contaminated surfaces. EFE is accompanied by photon emission and gas d...

    J. Halbritter in Applied Physics A (1986)