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Article
ARXPS studies of SiO2-SiC interfaces and oxidation of 6H SiC single crystal Si-(001) and C-(001) surfaces
The main puzzle in oxidation of hexagonal SiC is the slower rate of the Si-terminated surface as compared to the C-terminated surface, which is blamed on an unknown interface compound. ARXPS is a unique method...
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Article
Effect of the Weak Links on the Surface Resistance of YBa2Cu3Ox Bulk Material
Dc magnetic field, temperature, and magnetic history dependencies of the millimeter-wave surface resistance have been measured in high quality grain-aligned and in polycrystalline YBa2Cu3Ox bulk material. The mea...
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Article
On Extrinsic Effects in the Surface Impedance of Cuprate Superconductors
Presently, the rf surface impedance Z of cuprate superconductors is still shrinking with material improvements, which is shown clearly by Z = Z1+Zres still dominated by extrinsic properties summarized in Zres. We...
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Article
Surface Impedance and Granularity in Superconducting Cuprates
The rf residual surface resistance Rres is an important figure of merit for superconducting microwave devices and for establishing the homogeneity of superconducting surfaces. In granular superconductors not only...
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Article
Model of Si–SiO2 interfaces based on ARXPS measurements
Angle-resolved x-ray photoelectron spectroscopy (ARXPS) results in a very detailed analysis of minor amounts (≥0.3 nm) of interface compounds and their spatial distribution. First experimental results on the S...