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5 Result(s)

within J Halbritter Remove this filter Applied and Technical Physics Remove this filter

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  1. No Access

    Article

    ARXPS studies of SiO2-SiC interfaces and oxidation of 6H SiC single crystal Si-(001) and C-(001) surfaces

    The main puzzle in oxidation of hexagonal SiC is the slower rate of the Si-terminated surface as compared to the C-terminated surface, which is blamed on an unknown interface compound. ARXPS is a unique method...

    B. Hornetz, H-J. Michel, J. Halbritter in Journal of Materials Research (1994)

  2. No Access

    Article

    Effect of the Weak Links on the Surface Resistance of YBa2Cu3Ox Bulk Material

    Dc magnetic field, temperature, and magnetic history dependencies of the millimeter-wave surface resistance have been measured in high quality grain-aligned and in polycrystalline YBa2Cu3Ox bulk material. The mea...

    J. Wosik, L. M. **e, J. Halbritter, R. Chau, A. Samaan… in MRS Online Proceedings Library (1992)

  3. No Access

    Article

    On Extrinsic Effects in the Surface Impedance of Cuprate Superconductors

    Presently, the rf surface impedance Z of cuprate superconductors is still shrinking with material improvements, which is shown clearly by Z = Z1+Zres still dominated by extrinsic properties summarized in Zres. We...

    J. Halbritter in MRS Online Proceedings Library (1992)

  4. No Access

    Article

    Surface Impedance and Granularity in Superconducting Cuprates

    The rf residual surface resistance Rres is an important figure of merit for superconducting microwave devices and for establishing the homogeneity of superconducting surfaces. In granular superconductors not only...

    J. Halbritter in MRS Online Proceedings Library (1990)

  5. No Access

    Article

    Model of Si–SiO2 interfaces based on ARXPS measurements

    Angle-resolved x-ray photoelectron spectroscopy (ARXPS) results in a very detailed analysis of minor amounts (≥0.3 nm) of interface compounds and their spatial distribution. First experimental results on the S...

    J. Halbritter in Journal of Materials Research (1988)