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  1. Article

    Open Access

    The Potential of the Perturbed Angular Correlation Technique in Characterizing Semiconductors

    Several experimental techniques are available to investigate materials but microscopic techniques based on hyperfine interaction form a subclass that can characterize materials at the smallest possible atomic ...

    Rakesh Dogra, A.P. Byrne, M.C. Ridgway in Journal of Electronic Materials (2009)

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