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Article

Influence of stress on structural and dielectric anomaly of Bi2(Zn1/3Ta2/3)207 thin films

Bi₂(Zn_1/3Ta_2/3)₂O₇ (BZT) thin films were grown on the (111) oriented Pt/TiO_x/SiO₂/Si substrates using a pulsed laser deposition (PLD) technique. BZT thin films deposited at an oxygen partial pressure of 400 mTorr...

Jun Hong Noh, Hee Bum Hong, Kug Sun Hong in MRS Online Proceedings Library (2006)