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    Simulation Studies of Two-Layer Hopfield Neural Networks for Automatic Wafer Defect Inspection

    The occurrence of defect on a wafer may result in losing the yield ratio. The defective regions were usually identified through visual judgment with the aid of a scanning electron microscope. Dozens of people ...

    Chuan-Yu Chang, Hung-Jen Wang, Si-Yan Lin in Advances in Applied Artificial Intelligence (2006)