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    Chapter and Conference Paper

    TEM characterization of magnetic Sm- and Co-nanocrystals in SiC

    This paper presents analytical TEM characterization of magnetic Sm- and Co-nanocrystals buried in SiC. High resolution TEM has been applied to analyse the lattice structure and crystallography of the nanocryst...

    J Biskupek, U Kaiser, H Lichte, A Lenk, G Pasold in Microscopy of Semiconducting Materials (2005)