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    Deep Level Measurements of Layers on Semi-Insulating GaAs Substrates by Means of the Photofet Method

    Deep level measurements have been performed on three different types of sample: (l)Sn-doped layers diffused into SI-GaAs:Cr; (2) Sn-doped LPE-GaAs layers on SI-GaAs:Cr; and (3) Sn-doped layers diffused into hi...

    F. J. Tegude, K. Heime in Semi-Insulating III–V Materials (1980)