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    Chapter and Conference Paper

    Infrared Study of Oxygen Segregation at Structural Defects in Polycrystalline Silicon

    We have studied oxygen- and carbon-doped multicrystalline silicon samples. It was shown that a significant part of the oxygen incorporated into the samples was accumulated at extended structural defects and th...

    B. Pivac, A. Sassella, A. Borghesi in Progress in Fourier Transform Spectroscopy (1997)