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    Article

    Numerical Study on Overcurrent Process of High-Temperature Superconducting Coated Conductors

    Overcurrent performance of high-temperature superconducting (HTS) coated conductor (CC) is one of the most crucial parameters for industrial applications, especially in superconducting fault current limiters (...

    J. Sheng, D. Hu, K. Ryu, H. S. Yang in Journal of Superconductivity and Novel Mag… (2017)

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    Electrical-Thermal-Structural Coupled Finite Element Model of High Temperature Superconductor for Resistive Type Fault Current Limiters

    A multi-physics finite element model of high-temperature superconductors (HTS) will be presented in this article. The electrical-thermal model is mainly based on Maxwell’s equation and basic heat transfer equa...

    J. Sheng, Y. Chen, B. Lin, L. Ying, Z. ** in Journal of Superconductivity and Novel Mag… (2014)

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    Research on Endurable Electrodynamic Force of YBCO Coated Conductors During Quenching Process

    In a resistive superconducting fault current limiter (SFCL), the electrodynamic force among the YBCO tapes is enormous when experiencing a high short circuit current, which may cause deformation of tapes and d...

    J. Wen, B. Lin, J. Sheng, L. Ying, L. Yao in Journal of Superconductivity and Novel Mag… (2014)

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    Experimental and Numerical Study of Co-ordination of Resistive-Type Superconductor Fault Current Limiter and Relay Protection

    Superconducting fault current limiter (SFCL) has become one of the most ideal current limiting devices to solve the problem of increasing short-circuit current in high-voltage power grid. This paper presents a...

    Y. Chen, S. Li, J. Sheng, Z. **, Z. Hong in Journal of Superconductivity and Novel Mag… (2013)

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    Article

    Study of interfacial oxide layer of LaAlO3 gate dielectrics on Si for metal–insulator–semiconductor devices

    Lanthanum aluminate (LAO) thin films were deposited on silicon by pulsed-laser deposition. It was found that oxygen partial pressure played an essential role in the formation of an interfacial layer. The films...

    H. Ling, X. Lu, A. Li, D. Wu, Q. Shao, J. Sheng, Z. Liu, N. Ming in Applied Physics A (2005)