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Chapter and Conference Paper
X-Ray Diffraction from Graphite Intercalation Compounds Under Hydrostatic Pressure
X-ray diffraction studies of pressure-induced intralayer and interlayer structural phase transitions in alkali GIC’s are discussed with particular emphasis on KC24 and CsC36. It is shown that such transitions inv...
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Chapter and Conference Paper
Raman Studies of the Semiconductor to Metal Transition in Ge(As)
Using a YAG laser operating at 2.1 µm, polarized Raman spectra of Ge(As) have been measured as a function of impurity concentration. The impurity concentration ranged from, 6.3 × 1015 cm−3 (semiconducting regime)...