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Microstructure Evolution and the Constitutive Relations of High-Temperature Solders

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This study characterized the temperature-dependent constitutive parameters (yield strength, ultimate tensile strength, elastic modulus, strain hardening exponent) from the mechanical behavior of five high-temperature solders, 95Sn-5Sb, 95Pb-5In, 90Pb-10Sn, 92.5Pb-5Sn-2.5Ag, and 93Pb-3Sn-2In-2Ag, chosen such that T m > 518 K. To model appropriately their mechanical responses under high-temperature thermal cycling, where the temperatures exceed 473 K, the material’s parameters must be determined as a function of temperature. Uni-axial tensile tests were, therefore, carried out between 298 K and 473 K to determine the constitutive behavior of each solder. 95Sn-5Sb exhibited the highest strength over the temperature range tested except near 473 K. Pb-based alloys with a higher degree of solid solution (>5%) showed greater strengthening than those primarily strengthened by coarse precipitates. Additionally, microstructure changes in 90Pb-10Sn and 95Sn-5Sb were shown to be responsible for unexpected mechanical behavior at elevated temperatures.

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REFERENCES

  1. J.W. Morris and H.L. Reynolds, Proceedings of the Pacific Rim/ASME International Intersociety Electronic and Photonic Packaging Conference, INTERpack’97, vol. 2 (1997), p.␣1529.

  2. J. Glazer, J. Electron. Mater. 23, 693 (1994).

    Article  ADS  CAS  Google Scholar 

  3. T.T. Hitch, K. Palit, and A.N. Prabhu, International Conference on Electronic Assembly Material and Process Challenges, vol. 2 (1996), p. 1107.

  4. N.C. Lee, Solder Surf. Mt. Technol. 9, 116 (1997).

    Article  Google Scholar 

  5. M. Abtew and G. Selvaduray, Mater. Sci. Eng. Rep. R27, 95 (2000).

    Article  CAS  Google Scholar 

  6. J.H. Vincent and G. Humpston, GEC J. Res. 11, 76 (1994).

    Google Scholar 

  7. E. Suhir, Adv. Therm. Model. Electron. Compon. Syst. 1, 337 (1988).

    Google Scholar 

  8. B. Royce, Intersociety Conference on Thermal Phenomena Fabrication and Operation of Electronic Components, vol.␣11 (1998), p. 171.

  9. H. Nose, M. Sakane, Y. Tsukada, and H. Nishimura, J. Electron. Packag. 125, 59 (2003).

    Article  CAS  Google Scholar 

  10. S. Wen, L. Keer, S. Vaynman, and L. Lawson, IEEE Trans. Compon. Packag. Technol. 25, 23 (2002).

    Article  Google Scholar 

  11. W. Jones, Y. Liu, M. Shah, and R. Clarke, Solder Surf. Mt. Technol. 10, 37 (1998).

    Article  CAS  Google Scholar 

  12. A. Miric and A. Grusd, Solder Surf. Mt. Technol. 10, 19 (1998).

    Article  CAS  Google Scholar 

  13. H.J. Fecht, M.X. Zhang, Y.A. Chang, and J.H. Perepezko, Metall. Trans. A 20A, 795 (1989).

    ADS  CAS  Google Scholar 

  14. D. L. Decker, J. Weiss, and H. B. Vanfleet, Phys. Rev. B 16, 2392 (1977).

    Article  ADS  CAS  Google Scholar 

  15. A. Ascoli, L. Filoni, G. Poletti, and S. L. Rossi, Phys. Rev. B 10, 5003 (1974).

    Article  ADS  CAS  Google Scholar 

  16. T. Massalski, Binary Alloy Phase Diagrams (Metals Park, OH: ASM International, 1986).

  17. J. Shigley, Mechanical Engineering Design (New York: McGraw-Hill, 2004).

  18. G. Dieter, Mechanical Metallurgy (Boston: McGraw-Hill, 1986).

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ACKNOWLEDGEMENTS

The authors would like to thank Joe Krisciunas, Tony Colucci, Colin Mackenzie, and Roger Jones for their support of this program. This material was based on the work supported by the Department of Energy under award DE-FC26-06NT42950. This paper was prepared as an account of work sponsored by an agency of the U.S. Government. Neither the U.S. Government or any agency thereof, nor any of their employees, makes warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product or process disclosed, or represents that its use would not infringe on privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its␣endorsement, recommendation, or favoring by the␣U.S. Government or any agency thereof. The views and opinions of the authors expressed herein do not␣necessarily state or reflect those of the U.S. Government or any agency thereof. The Government reserves for itself and others acting on its behalf a royalty-free, nonexclusive, irrevocable, worldwide license for governmental purposes to publish, distribute, translate, duplicate, exhibit, and perform this copyrighted paper.

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Correspondence to Junghyun Cho.

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Schoeller, H., Bansal, S., Knobloch, A. et al. Microstructure Evolution and the Constitutive Relations of High-Temperature Solders. J. Electron. Mater. 38, 802–809 (2009). https://doi.org/10.1007/s11664-009-0767-6

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  • DOI: https://doi.org/10.1007/s11664-009-0767-6

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