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The analysis of the capacitance of p-InAlAs/i-InGaAs/n-InAlAs infrared photodetector

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Abstract

The capacitance of the photodiode still remains some ignored issues. It will facilitate the further analysis and simulation of the capacitance of photodiodes to analyze on the capacitance of the p–i–n InAlAs/InGaAs/InAlAs infrared photodiode. In this paper, the capacitance is divided into two parts, diffusion capacitance and depletion capacitance, to discuss with models in which we solve the divergence of depletion capacitance(CT) at forward bias and take the deep level traps into consideration. Furthermore, we explore the dependence with the delay factor by the calculation of capacitance–voltage (C–V) characteristics. It shows that the delay factor is related to the applied voltage and the frequency.

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References

  • Abdulwahid, O.S., Sexton, J., Kostakis, I., Ian, K., Missous, M.: Physical modelling and experimental characterisation of InAlAs/InGaAs avalanche photodiode for 10Gb/s data rates and higher. IET Optoelectron. 12, 5–10 (2018)

    Article  Google Scholar 

  • Abdulwahid, O.S., Kostakis, I., Muttlak, S.G., Sexton, J., Ian, K., Missous, M.: Physical modelling of InGaAs–InAlAs APD and PIN photodetectors for >25 Gb/s data rate applications. IET Optoelectron. 13, 40–45 (2019)

    Article  Google Scholar 

  • Billet, M., Bretin, S., Bavedila, F., Avramovic, V., Wallart, X., Coinon, C., Lampin, J.F., Ducournau, G., Peytavit, E.: InAlAs/InGaAs-MSM photodetectors based on optical cavity using metallic mirrors: THz frequency operation, high quantum efficiency and high saturation current. Appl. Phys. Lett. 114, 161104 (2019)

    Article  ADS  Google Scholar 

  • Chimitova, E. V., Chetvertakova, E. S.: Goodness-of-fit testing for the degradation models in reliability analysis. In: 2018 XIV International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE), Novosibirsk, Russia, pp. 45–48 (2018)

  • Cui, A.L., Sun, C.H., Wang, F., Ye, Z.H.: Electrical properties of plasma-free ultra-low-temperature ALD ZnS passivation on p-Type HgCdTe. Infrared Phys. Technol. 114, 103667 (2021)

    Article  Google Scholar 

  • Ji, X.L., Liu, B.Q., Xu, Y., Tang, H.J., Li, X., Gong, H.M., Shen, B., Yang, X.L., Han, P., Yan, F.: Deep-level traps induced dark currents in extended wavelength InxGa1-xAs/InP photodetector. J. Appl. Phys. 114, 224502 (2013)

    Article  ADS  Google Scholar 

  • Kawaguchi, K., Fukasawa, T., Takazawa, I., Shida, H., Saito, Y., Iizasa, D., Saito, T., Kitada, T., Ishitani, Y., Kohda, M., Morita, K.: Transient diffusive spin dynamics in intrinsic InGaAs/InAlAs multiple quantum wells. Appl. Phys. Lett. 115, 172406 (2019)

    Article  ADS  Google Scholar 

  • Lin, S.D., Ilchenko, V.V., Marin, V.V., Shkil, N.V., Buyanin, A.A., Panarin, K.Y., Tretyak, O.V.: Observation of the negative differential capacitance in Schottky diodes with InAs quantum dots near room temperature. Appl. Phys. Lett. 90, 263114 (2007)

    Article  ADS  Google Scholar 

  • Lin, C.K., Chiu, H.C., Lin, C.W., Wang, H.C., Wu, Y.C.: Optoelectronic mixer based on composite transparent gate InAlAs–InGaAs metamorphic HEMTs. J. Lightwave Technol. 28, 2153–2161 (2010)

    Article  ADS  Google Scholar 

  • Mattera, V.D., Antreasyan, A., Garbinski, P.A., Temkin, H., Olsson, N.A., Filipe, J.: Monolithic InGaAs p–i–n InP metal-insulator-semiconductor field-effect transistor receiver for long-wavelength optical communications. Appl. Phys. Lett. 57, 1343–1344 (1990)

    Article  ADS  Google Scholar 

  • Meilan-Vila, A., Opsomer, J.D., Francisco-Fernandez, M., Crujeiras, R.M.: A goodness-of-fit test for regression models with spatially correlated errors. TEST 29, 728–749 (2020)

    Article  MathSciNet  Google Scholar 

  • Movassaghi, Y., Fathipour, V., Fathipour, M., Mohseni, H.: Analytical and numerical evaluation of electron-injection detector optimized for SWIR photon detection. J. Appl. Phys. 121, 084501 (2017)

    Article  ADS  Google Scholar 

  • Nakano, S., Taguchi, H.: Analysis of intrinsic delay time in InAlAs/InGaAs high-electron-mobility transistors at cryogenic temperature. In: TENCON 2017—2017 IEEE Region 10 Conference, Penang, pp. 1685–1689 (2017)

  • Natarajan, S.: An effective approach to obtain model parameters for BJTS and FETS from data books. IEEE Trans. Educ. 35, 164–169 (1992)

    Article  Google Scholar 

  • Ren, M., Maddox, S.J., Woodson, M.E., Chen, Y.J., Bank, S.R., Campbell, J.C.: AlInAsSb separate absorption, charge, and multiplication avalanche photodiodes. Appl. Phys. Lett. 108, 191108 (2016)

    Article  ADS  Google Scholar 

  • Sun, Y.T., Omanakuttan, G., Lourdudoss, S.: An InP/Si heterojunction photodiode fabricated by self-aligned corrugated epitaxial lateral overgrowth. Appl. Phys. Lett. 106, 213504 (2015)

    Article  ADS  Google Scholar 

  • Sze, S.M., Ng K.K.: Physics of Semiconductor Devices, 3rd edn. Wiley, New Jersey (2006)

    Book  Google Scholar 

  • Wang, Y.D., Chen, J., Xu, J.T., Li, X.Y.: Modeling of frequency-dependent negative differential capacitance in InGaAs/InP photodiode. Infrared Phys. Technol. 89, 41–45 (2018)

    Article  ADS  Google Scholar 

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Acknowledgments

This project is supported by the National Natural Science Foundation of China (61774108).

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Correspondence to Jun Chen.

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Yang, B., Chen, J. The analysis of the capacitance of p-InAlAs/i-InGaAs/n-InAlAs infrared photodetector. Opt Quant Electron 53, 275 (2021). https://doi.org/10.1007/s11082-021-02919-7

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