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Non-destructive elemental depth-profiling with muonic X-rays

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Abstract

An elemental analysis method using muonic X-rays has been developed. Applying the unique features of the negative muon, this method enables elemental distribution in an object to be obtained three dimensionally and non-destructively. Especially, by choosing the incident muon beam energy, depth-profiling as deep as several cm from the surface can be achieved by detecting the high energy muonic X-rays carrying the information of the atom which captured the muon. We obtained some preliminary results and showed the applicability of the technique in future analytical facilities.

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Authors and Affiliations

  1. International Christian University, Mitaka, Tokyo, 181-8585, Japan

    M. K. Kubo, H. Moriyama & Y. Tsuruoka

  2. Japan Atomic Energy Agency, Ibaraki, 319-1195, Japan

    S. Sakamoto

  3. National Museum of Japanese History, Sakura, Chiba, 285-8502, Japan

    E. Koseto & T. Saito

  4. High Energy Accelerator Research Organization, Tsukuba, Ibaraki, 305-0805, Japan

    K. Nishiyama

Authors
  1. M. K. Kubo
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  2. H. Moriyama
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  3. Y. Tsuruoka
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  4. S. Sakamoto
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  5. E. Koseto
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  6. T. Saito
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  7. K. Nishiyama
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Corresponding author

Correspondence to M. K. Kubo.

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Kubo, M.K., Moriyama, H., Tsuruoka, Y. et al. Non-destructive elemental depth-profiling with muonic X-rays. J Radioanal Nucl Chem 278, 777–781 (2008). https://doi.org/10.1007/s10967-008-1610-x

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  • DOI: https://doi.org/10.1007/s10967-008-1610-x

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