Abstract
Polycrystalline FexPd1−x (x = 37–64 at.%) films with thicknesses of 47 ± 2 nm were prepared by dc magnetron sputtering on quartz glass substrates and subsequent annealing at 550 °C for 3 h. The evolution of crystal structure and magnetic properties with different Fe concentrations were investigated. For the Pd-rich FePd films, the A1 disordered phase and soft magnetic properties were found. The Fe-rich FePd films are more favorable to the formation of an ordered L10 phase. For Fe concentration of 51 at.%, the sample exhibits the highest coercivity, magnetic energy product and remanence ratio at room temperature, corresponding to 3.5 kOe, 17.6 MGOe and 0.94, respectively, and the coercivity increases to ~4.3 kOe at 120 K. The disorder-order transition temperature is evidently reduced to 550 °C and magnetic properties are improved in this work. These FePd films have shown promise for application as high-density magnetic recording medium.
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Acknowledgements
This work is supported by the Guangxi Natural Science Foundation (2016GXNSFAA380030, 2013GXNSFBA019242), Innovation Project of GUET Graduate Education (YJCXS201564) and the National Natural Science Foundation of China (51461012, 51261004).
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Liu, T., Ma, L., Zhao, S.Q. et al. Crystal structure and magnetic properties of FexPd1−x thin films annealed at 550 °C. J Mater Sci: Mater Electron 28, 3616–3620 (2017). https://doi.org/10.1007/s10854-016-5963-6
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DOI: https://doi.org/10.1007/s10854-016-5963-6