Abstract
In this work, heteroepitaxial Bi0.90La0.10Fe0.95Mn0.05O3 (BLFMO) thin films have been grown on Si (100) substrate using LaNiO3/CeO2/Y0.08Zr0.92O3 buffer layers and on SrTiO3 (STO) substrate using pulsed laser deposition. SrRuO3 (SRO) has been used as a bottom electrode in both cases. AC conductivity analysis reveals that BLFMO films deposited on SrTiO3 (STO) substrate are governed by translational hop**, while those deposited on Si are governed by relocalized reorientation hop**. Also, films on STO have DC conductivity dominance over the low frequency range. The remnant polarization for the films deposited on Si and STO is 24 and 66 µC/cm2, while the coercive field is 280 kV/cm and 251 kV/cm, respectively. Impedance and modulus analysis reveals that both the samples show electrical heterogeneity. The leakage current mechanism can be well explained using space charge limited current (SCLC) and Fowler–Nordheim (FN) conduction mechanism for films deposited on all substrates. Films deposited on STO have Schottky behavior at low field and SCLC and FN tunneling current mechanism.
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Acknowledgements
The author thanks IRCC, IIT Bombay for providing vibrating sample magnetometer and broadband dielectric spectrometer facilities.
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Part of the work has been carried out at IIT Bombay as a part of PhD thesis.
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Kolte, J., Gopalan, P. Growth of heteroepitaxial La and Mn co-substituted BiFeO3 thin films on Si (100) substrate by pulsed laser deposition. Appl. Phys. A 128, 763 (2022). https://doi.org/10.1007/s00339-022-05900-7
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DOI: https://doi.org/10.1007/s00339-022-05900-7