Abstract
The authors report on the use of a burst-mode ultrashort pulsed laser source with an emitting wavelength of 1030 nm on to micro-machining plane areas of glass with different pulse durations, burst energies, and number of sub-pulses per burst with intra-burst rates of 65 MHz and 2.5 GHz. In the investigated parameter range, the maximum specific removal rates are obtained with \(11.2\,\upmu \text{m}^{3}/\upmu \text{J}\) for MHz bursts and \(27.0\,\upmu \text{m}^{3}/\upmu \text{J}\) for GHz bursts, being up to four times higher compared to the non-burst regime. The depth per scan and the surface roughness increase at higher burst energies and at a higher number of sub-pulses per burst, respectively. Furthermore, a significant difference in the resulting surface topography between MHz and GHz bursts is shown by SEM images, mainly depending on the number of sub-pulses per burst.
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References
M. Perry, B. Stuart, P. Banks, M. Feit, V. Yanovsky, A. Rubenchik, J. Appl. Phys. 85(9), 6803 (1999). https://doi.org/10.1063/1.370197
H. Misawa, S. Juodkazis, 3D Laser Microfabrication: Principles and Applications (Wiley, New York, 2006)
K. Sugioka, Y. Cheng, Light Sci. Appl. 3(4), e149 (2014). https://doi.org/10.1038/lsa.2014.30
G. Lott, N. Falletto, P.J. Devilder, R. Kling, J. Laser Appl. 28(2), 022206 (2016). https://doi.org/10.2351/1.4944509
S. Richter, S. Döring, A. Tünnermann, S. Nolte, Appl. Phys. A 103(2), 257 (2011). https://doi.org/10.1007/s00339-011-6369-1
F. Zimmermann, S. Richter, S. Döring, A. Tünnermann, S. Nolte, Appl. Opt. 52(6), 1149 (2013). https://doi.org/10.1364/AO.52.001149
L. Keldysh et al., Sov. Phys. JETP 20(5), 1307 (1965)
L. Fechner, High-Resolution Experiments on Strong-Field Ionization of Atoms and Molecules: Test of Tunneling Theory, the Role of Doubly Excited States, and Channel-Selective Electron Spectra (Springer, Berlin, 2016)
B. Stuart, M. Feit, S. Herman, A. Rubenchik, B. Shore, M. Perry, Phys. Rev. B 53(4), 1749 (1996). https://doi.org/10.1103/PhysRevB.53.1749
E.G. Gamaly, A.V. Rode, B. Luther-Davies, V.T. Tikhonchuk, Phys. Plasmas 9(3), 949 (2002). https://doi.org/10.1063/1.1447555
L. Haahr-Lillevang, P. Balling, in Pacific Rim Laser Damage 2015: Optical Materials for High-Power Lasers, vol. 9532 (International Society for Optics and Photonics, 2015), p. 953213. https://doi.org/10.1117/12.2185834
B. Rethfeld, Phys. Rev. Lett. 92(18), 187401 (2004). https://doi.org/10.1103/PhysRevLett.92.187401
I. Mirza, N.M. Bulgakova, J. Tomáštík, V. Michálek, O. Haderka, L. Fekete, T. Mocek, Sci. Rep. 6(1), 1 (2016). https://doi.org/10.1038/srep39133
B.C. Stuart, M.D. Feit, S. Herman, A.M. Rubenchik, B.W. Shore, M.D. Perry, JOSA B 13(2), 459 (1996). https://doi.org/10.1364/JOSAB.13.000459
X. Liu, D. Du, G. Mourou, IEEE J. Quantum Electron. 33(10), 1706 (1997). https://doi.org/10.1109/3.631270
L. Jiang, H.L. Tsai, J. Appl. Phys. 100(2), 023116 (2006). https://doi.org/10.1063/1.2216882
D. Giguère, G. Olivié, F. Vidal, S. Toetsch, G. Girard, T. Ozaki, J.C. Kieffer, O. Nada, I. Brunette, JOSA A 24(6), 1562 (2007). https://doi.org/10.1364/JOSAA.24.001562
B. Chimier, O. Utéza, N. Sanner, M. Sentis, T. Itina, P. Lassonde, F. Légaré, F. Vidal, J. Kieffer, Phys. Rev. B 84(9), 094104 (2011). https://doi.org/10.1103/PhysRevB.84.094104
M. Lebugle, N. Sanner, N. Varkentina, M. Sentis, O. Utéza, J. Appl. Phys. 116(6), 063105 (2014). https://doi.org/10.1063/1.4892158
O. Utéza, N. Sanner, B. Chimier, A. Brocas, N. Varkentina, M. Sentis, P. Lassonde, F. Légaré, J. Kieffer, Appl. Phys. A 105(1), 131 (2011). https://doi.org/10.1007/s00339-011-6469-y
M. Lebugle, N. Sanner, O. Utéza, M. Sentis, Appl. Phys. A 114(1), 129 (2014). https://doi.org/10.1007/s00339-013-8153-x
D. Du, X. Liu, G. Korn, J. Squier, G. Mourou, Appl. Phys. Lett. 64(23), 3071 (1994). https://doi.org/10.1063/1.111350
B. Stuart, M. Feit, A. Rubenchik, B. Shore, M. Perry, Phys. Rev. Lett. 74(12), 2248 (1995). https://doi.org/10.1103/PhysRevLett.74.2248
X. Zeng, X. Mao, S.S. Mao, J.H. Yoo, R. Greif, R.E. Russo, J. Appl. Phys. 95(3), 816 (2004). https://doi.org/10.1063/1.1635990
D. Nieto, J. Arines, G.M. ÖConnor, M.T. Flores-Arias, Appl. Opt. 54(29), 8596 (2015). https://doi.org/10.1364/AO.54.008596
J. Furmanski, A. Rubenchik, M. Shirk, B. Stuart, J. Appl. Phys. 102(7), 073112 (2007). https://doi.org/10.1063/1.2794376
G. Raciukaitis, M. Brikas, P. Gecys, B. Voisiat, M. Gedvilas et al., JLMN J. Laser Micro/Nanoeng. 4(3), 186 (2009). https://doi.org/10.2961/jlmn.2009.03.0008
B. Neuenschwander, G.F. Bucher, C. Nussbaum, B. Joss, M. Muralt, U.W. Hunziker, P. Schuetz, in Laser Applications in Microelectronic and Optoelectronic Manufacturing XV, vol. 7584 (SPIE, 2010), pp. 99–112. https://doi.org/10.1117/12.846521
S.M. Remund, M. Gafner, M.V. Chaja, A. Urniezius, S. Butkus, B. Neuenschwander, Procedia CIRP 94, 850 (2020). https://doi.org/10.1016/j.procir.2020.09.111
P. Lickschat, D. Metzner, S. Weißmantel, J. Laser Appl. 33(4), 042002 (2021). https://doi.org/10.2351/7.0000437
B. Jaeggi, B. Neuenschwander, U. Hunziker, J. Zuercher, T. Meier, M. Zimmermann, K.H. Selbmann, G. Hennig, in Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XVII, vol. 8243 (International Society for Optics and Photonics, 2012), p. 82430K. https://doi.org/10.1117/12.909844
B. Jaeggi, S. Remund, R. Streubel, B. Goekce, S. Barcikowski, B. Neuenschwander, J. Laser Micro/Nanoeng. 12(3) (2017). https://doi.org/10.2961/jlmn.2017.03.0016
A. Žemaitis, M. Gaidys, P. Gečys, G. Račiukaitis, M. Gedvilas, Opt. Lasers Eng. 114, 83 (2019). https://doi.org/10.1016/j.optlaseng.2018.11.001
G. Bonamis, K. Mishchick, E. Audouard, C. Hönninger, E. Mottay, J. Lopez, I. Manek-Hönninger, J. Laser Appl. 31(2), 022205 (2019). https://doi.org/10.2351/1.5096087
A. Žemaitis, M. Gaidys, P. Gečys, M. Barkauskas, M. Gedvilas, Opt. Express 29(5), 7641 (2021). https://doi.org/10.1364/OE.417883
D. Metzner, P. Lickschat, S. Weißmantel, J. Laser Appl. 33(1), 012057 (2021). https://doi.org/10.2351/7.0000352
F. Caballero-Lucas, K. Obata, K. Sugioka, Int. J. Extreme Manuf. 4(1), 015103 (2022). https://doi.org/10.1088/2631-7990/ac466e
S. Schwarz, S. Rung, C. Esen, R. Hellmann, Opt. Lett. 46(2), 282 (2021). https://doi.org/10.1364/OL.415959
C. Kerse, H. Kalaycıoğlu, P. Elahi, B. Çetin, D.K. Kesim, Ö. Akçaalan, S. Yavaş, M.D. Aşık, B. Öktem, H. Hoogland et al., Nature 537(7618), 84 (2016). https://doi.org/10.1038/nature18619
N. Hodgson, H. Allegre, A. Starodoumov, S. Bettencourt, J. Laser Micro/Nanoeng. 15(3) (2020). https://doi.org/10.2961/jlmn.2020.03.2014
S. Hendow, H. Takahashi, M. Yamaguchi, J. Xu, in Laser-Based Micro-and Nanoprocessing XIV, vol. 11268 (International Society for Optics and Photonics, 2020), p. 1126809. https://doi.org/10.1117/12.2542582
S. Karimelahi, L. Abolghasemi, P.R. Herman, Appl. Phys. A 114(1), 91 (2014). https://doi.org/10.1007/s00339-013-8155-8
X. Jia, X. Zhao, Opt. Lett. 45(13), 3390 (2020). https://doi.org/10.1364/OL.396360
W. Liu, S. Chin, Opt. Express 13(15), 5750 (2005). https://doi.org/10.1364/OPEX.13.005750
W. Hu, Y.C. Shin, G. King, Appl. Phys. Lett. 99(23), 234104 (2011). https://doi.org/10.1063/1.3665631
D. Metzner, P. Lickschat, S. Weißmantel, Appl. Surf. Sci. 531, 147270 (2020). https://doi.org/10.1016/j.apsusc.2020.147270
A.C. Tien, S. Backus, H. Kapteyn, M. Murnane, G. Mourou, Phys. Rev. Lett. 82(19), 3883 (1999). https://doi.org/10.1103/PhysRevLett.82.3883
N. Varkentina, N. Sanner, M. Lebugle, M. Sentis, O. Utéza, J. Appl. Phys. 114(17), 173105 (2013). https://doi.org/10.1063/1.4829015
M. Sparks, D. Mills, R. Warren, T. Holstein, A. Maradudin, L. Sham, E. LohJr, D. King, Phys. Rev. B 24(6), 3519 (1981). https://doi.org/10.1103/PhysRevB.24.3519
N. Bloembergen, IEEE J. Quantum Electron. 10(3), 375 (1974). https://doi.org/10.1109/JQE.1974.1068132
T. Jia, R. Li, Z. Liu, Z. Xu, Appl. Phys. A 74(4), 503 (2002). https://doi.org/10.1007/s003390100903
D. Metzner, P. Lickschat, S. Weißmantel, Appl. Phys. A 125(7), 1 (2019). https://doi.org/10.1007/s00339-019-2755-x
B. Neuenschwander, B. Jaeggi, D.J. Foerster, T. Kramer, S. Remund, J. Laser Appl. 31(2), 022203 (2019). https://doi.org/10.2351/1.5096083
D.J. Förster, S. Faas, S. Gröninger, F. Bauer, A. Michalowski, R. Weber, T. Graf, Appl. Surf. Sci. 440, 926 (2018). https://doi.org/10.1016/j.apsusc.2018.01.297
A.A. Foumani, D.J. Förster, H. Ghorbanfekr, R. Weber, T. Graf, A.R. Niknam, Appl. Surf. Sci. 537, 147775 (2021). https://doi.org/10.1016/j.apsusc.2020.147775
D. Arnold, E. Cartier, Phys. Rev. B 46(23), 15102 (1992). https://doi.org/10.1103/PhysRevB.46.15102
B. Rethfeld, S. Linden, L. Englert, M. Wollenhaupt, L. Haag, C. Sarpe-Tudoran, T. Baumert, in High-Power Laser Ablation VII, vol. 7005 (SPIE, 2008), pp. 184–195. https://doi.org/10.1117/12.784630
P. Audebert, P. Daguzan, A. DosSantos, J. Gauthier, J. Geindre, S. Guizard, G. Hamoniaux, K. Krastev, P. Martin, G. Petite et al., Phys. Rev. Lett. 73(14), 1990 (1994). https://doi.org/10.1103/PhysRevLett.73.1990
G. Petite, P. Daguzan, S. Guizard, P. Martin, Nucl. Instrum. Methods Phys. Res. Sect. B Beam Interact. Mater. Atoms 107(1–4), 97 (1996). https://doi.org/10.1016/0168-583X(95)00845-4
I.M. Burakov, N.M. Bulgakova, R. Stoian, A. Rosenfeld, I.V. Hertel, Appl. Phys. A 81(8), 1639 (2005). https://doi.org/10.1007/s00339-005-3320-3
J.M. Guay, A. CalàLesina, J. Baxter, G. Killaire, L. Ramunno, P. Berini, A. Weck, Adv. Opt. Mater. 6(17), 1800189 (2018). https://doi.org/10.1002/adom.201800189
L.H. HolwayJr, D. Fradin, J. Appl. Phys. 46(1), 279 (1975). https://doi.org/10.1063/1.321378
C. Yao, S. Xu, Y. Ye, Y. Jiang, R. Ding, W. Gao, X. Yuan, J. Alloys Compd. 722, 235 (2017). https://doi.org/10.1016/j.jallcom.2017.06.080
M. Hagner, P. Sulzer, A. Liehl, M. Cimander, H. Kempf, A. Bitzer, A. Herter, A. Leitenstorfer, Opt. Express 29(21), 33632 (2021). https://doi.org/10.1364/OE.433703
E. Stratakis, J. Bonse, J. Heitz, J. Siegel, G. Tsibidis, E. Skoulas, A. Papadopoulos, A. Mimidis, A.C. Joel, P. Comanns et al., Mater. Sci. Eng. R Rep. 141, 100562 (2020). https://doi.org/10.1016/j.mser.2020.100562
Acknowledgements
The authors gratefully acknowledge financial support by the European Social Fund for Germany (ESF) in the funding project EilaSax no. 1003 395 06 and Qualitätsoptimierter Hochrateabtrag no. 1003 606 36. Furthermore, the authors acknowledge ACSYS Lasertechnik GmbH for providing the laser beam source and assisting with the experiments.
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Metzner, D., Lickschat, P., Kreisel, C. et al. Study on laser ablation of glass using MHz-to-GHz burst pulses. Appl. Phys. A 128, 637 (2022). https://doi.org/10.1007/s00339-022-05776-7
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DOI: https://doi.org/10.1007/s00339-022-05776-7