Abstract
Since 2012, it is publicly known that the bitstream encryption feature of modern **linx FPGAs can be broken by side-channel analysis. Presented at CT-RSA 2012, using graphics processing units (GPUs) the authors demonstrated power analysis attacks mounted on side-channel evaluation boards optimized for power measurements. In this work, we extend such attacks by moving to the EM side channel to examine their practical relevance in real-world scenarios. Furthermore, by following a certain measurement procedure we reduce the search space of each part of the attack from \(2^{32}\) to \(2^8\), which allows mounting the attacks on ordinary workstations. Several **linx FPGAs from different families – including the 7 series devices – are susceptible to the attacks presented here.
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Notes
- 1.
MC: MixColumns, SR: ShiftRows, SB: SubBytes.
- 2.
As a side note, we found this leakage model by coincidence, and it is valid for all considered FPGAs and for both power and EM leakages.
- 3.
We have also followed the suggestions of [8] to examine the squared error between the measured leakages l and estimated leakages \(\hat{l}\), but our analyses showed better distinguishability when correlation is estimated instead.
- 4.
We realized that other components on the PCB (BASYS 3 from www.digilentinc.com) introduce noise into the EM measurements.
- 5.
It is done in two parts since the second part can be started when \(k_{14}\) has already been recovered.
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Acknowledgment
The authors would like to acknowledge Alexander Jakimowic and Oliver Mischke for their help with development of the setup. The research in this work was supported in part by the DFG Research Training Group GRK 1817/1.
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Moradi, A., Schneider, T. (2016). Improved Side-Channel Analysis Attacks on **linx Bitstream Encryption of 5, 6, and 7 Series. In: Standaert, FX., Oswald, E. (eds) Constructive Side-Channel Analysis and Secure Design. COSADE 2016. Lecture Notes in Computer Science(), vol 9689. Springer, Cham. https://doi.org/10.1007/978-3-319-43283-0_5
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DOI: https://doi.org/10.1007/978-3-319-43283-0_5
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