Plane Defect Detection Based on 3D Point Cloud

  • Conference paper
  • First Online:
Advanced Computational Intelligence and Intelligent Informatics (IWACIII 2023)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 1932))

  • 290 Accesses

Abstract

In the production of industrial products, surface defect detection is mostly carried out through manual inspection. However, this detection method has several shortcomings, such as low efficiency, limited accuracy, and high inspection costs. To address these issues, we design an improved random sampling consistency (RANSAC) algorithm based on adaptive parameters of 3D point cloud data for plane defect detection. The main steps of our algorithm include the down sampling function which contains adaptive parameters, optimized based on KD-tree proximity substitution method. Our algorithm also includes the RANSAC segmentation and fitting plane function of adaptive parameters. Experimental results demonstrate that our algorithm can accurately identify protrusions or indentations defects of 1 mm or larger in those planes based on point clouds data, with a recognition rate more than 90%. The experimental results validate the suitability of our algorithm for industrial applications, offering an efficient and cost-effective solution for plane defect detection.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 89.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 119.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free ship** worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

References

  1. Luo, Q., Fang, X.: Automated visual defect detection for flat steel surface: a survey. IEEE Trans. Instrum. Meas. 69(3), 626–644 (2020)

    Article  Google Scholar 

  2. Garcia, N.M., de Erausquin, I., Edmiston, C., Gruev, V.: Surface normal reconstruction using circularly polarized light. Opt. Express 23(11), 14391–14406 (2015)

    Article  Google Scholar 

  3. Zhang, K.: Study on fast detection method of defects of automobile painting surface. DongHua University (2015)

    Google Scholar 

  4. Wolf, K., Roller, D., Schäfer, D.: An approach to computer-aided quality control based on 3D coordinate metrology. J. Mater. Process. Tech. 107(1), 96–110 (2000)

    Article  Google Scholar 

  5. Lichun, S., Yun, Y.: Filtering of airborne LiDAR point cloud data based on car(p, q) model and mathematical morphology. Acta Geod. Cartogr. Sin. 41(2), 219–224 (2012)

    Google Scholar 

  6. Perona, P., Malik, J.: Scale-space and edge detection using anisotropic diffusion. IEEE Trans. Pattern Anal. Mach. Intell. 12(7), 629–639 (1990)

    Article  Google Scholar 

  7. Meiju, L., Rui, Z.: Application of improved Otsu threshold segmentation algorithm in mobile phone screen defect detection. In: 2020 Chinese Control And Decision Conference (CCDC), Hefei, China, pp. 4919–4924 (2020)

    Google Scholar 

  8. Charles, R.Q., Su, H., Kaichun, M., Guibas, L.J.: PointNet: deep learning on point sets for 3D classification and segmentation. In: 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR), Honolulu, HI, USA, pp. 77–85 (2017)

    Google Scholar 

  9. Qi, C.R., Yi, L., Su, H., Guibas, L.J.: PointNet++: deep hierarchical feature learning on point sets in a metric space. In: Proceedings of the 31st International Conference on Neural Information Processing Systems (NIPS’17), NY, USA, pp. 5105–5114 (2017)

    Google Scholar 

  10. Wu, W., Qi, Z., Fuxin, L.: PointConv: deep convolutional networks on 3D point clouds. In: IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Long Beach, CA, USA, pp. 9613–9622 (2019)

    Google Scholar 

  11. Li, Y., Junxiang, T., Hua, L.: Registration of TLS and MLS point cloud combining genetic algorithm with ICP. Acta Geod. Cartogr. Sin. 47(4), 528–536 (2018)

    Google Scholar 

  12. Andrew, W., Amanatides, J.: Voxel occlusion testing: a shadow determination accelerator for ray tracing. In: Proceedings of the Conference, Halifax, Nova Scotia, Canada, pp. 1–2 (1990)

    Google Scholar 

  13. Sijie, T., Ruilin, B.: Point cloud registration method based on key point optimization after downsampling. Appl. Res. Comp. 38(03), 904–907 (2021)

    Google Scholar 

  14. Fischler, M.A., Bolles, R.C.: Random sample consensus: a paradigm for model fitting with applications to image analysis and automated cartography. Commun. ACM 24(6), 381–395 (1981)

    Article  MathSciNet  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Hongbin Ma .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2024 The Author(s), under exclusive license to Springer Nature Singapore Pte Ltd.

About this paper

Check for updates. Verify currency and authenticity via CrossMark

Cite this paper

Bai, M., Wu, S., Ma, H., **, Y. (2024). Plane Defect Detection Based on 3D Point Cloud. In: **n, B., Kubota, N., Chen, K., Dong, F. (eds) Advanced Computational Intelligence and Intelligent Informatics. IWACIII 2023. Communications in Computer and Information Science, vol 1932. Springer, Singapore. https://doi.org/10.1007/978-981-99-7593-8_6

Download citation

  • DOI: https://doi.org/10.1007/978-981-99-7593-8_6

  • Published:

  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-99-7592-1

  • Online ISBN: 978-981-99-7593-8

  • eBook Packages: Computer ScienceComputer Science (R0)

Publish with us

Policies and ethics

Navigation