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Quantum Microwave Measurements

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Handbook of Metrology and Applications

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Abstract

The term “quantum microwave measurement” stands for the measurement of microwave parameters by exploiting the properties of atomic energy levels and related transitions in presence of optical/laser signal. In other words, it can be stated that atoms work like a transducer, converting microwave E-Field and H-Field strengths into observable changes in optical signals. A real-time application of microwave in this domain was first investigated by Christopher and their group, where they have sensed RF electric field strength by measuring the frequency split of electromagnetically induced transparency signal in the presence RF field applied between the Rydberg states (Holloway et al. 2014a). The beauty of this experiment was that the RF E-Field strength could be made directly traceable to Planck’s constant thus reducing the uncertainties associated with other methods of measurement of E-Field using various classical probes. After that, numerous research was done by various researchers and still undergoing utilizing the optical and microwave field interaction with Rydberg atom-based systems, such as broadband RF E-Field sensing, frequency modulation, frequency up-conversion, frequency down-conversion, etc. The interaction of electromagnetic field with atomic system results in specific phenomena such as EIT and ATS (Boller et al. 1991; Marangos 1997; Anisimov et al. 2011), which also form the basis of all these applications. Therefore, in this chapter first we will discuss basic properties of Rydberg atoms, followed by the interaction of electromagnetic field with two-level atomic system. Later, EIT and ATS phenomena in a three-level system and applications will be discussed. Some of the devices based on these phenomena such as electric field sensors, microwave mixers as well as receiver for communication purposes will also be discussed in detail. As Rydberg atoms are the heart of the Quantum Microwave Measurements, different methods of fabrication of atomic vapor cells with their advantages and disadvantages will also be discussed in brief.

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Author information

Authors and Affiliations

  1. Academy of Science & Innovative Research (AcSIR), Ghaziabad, India

    Monika Thakran, Asheesh Kumar Sharma & Satya Kesh Dubey

  2. CSIR-National Physical Laboratory, New Delhi, India

    Yashika Aneja, Monika Thakran, Asheesh Kumar Sharma & Satya Kesh Dubey

  3. Solid State Institute, Technion-Israel Institute of Technology, Haifa, Israel

    Harish Singh Rawat

Authors
  1. Yashika Aneja
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  2. Monika Thakran
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  3. Asheesh Kumar Sharma
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  4. Harish Singh Rawat
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  5. Satya Kesh Dubey
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Corresponding author

Correspondence to Satya Kesh Dubey .

Editor information

Editors and Affiliations

  1. Bhabha Atomic Research Centre, Mumbai, Maharashtra, India

    Dinesh K. Aswal

  2. Physico-Mechanical Metrology, CSIR - National Physical Laboratory, New Delhi, Delhi, India

    Sanjay Yadav

  3. National Metrology Institute of Japan, National Institute of Advanced Industria, Ibaraki, Japan

    Toshiyuki Takatsuji

  4. National Institute of Standards and Tech, GAITHERSBURG, MD, USA

    Prem Rachakonda

  5. Mechanical Engineering Department, National Institute of Technology, Delhi, India

    Harish Kumar

Section Editor information

  1. CSIR-National Physical Laboratory, New Delhi, India

    S. K Dubey PhD

  2. Health, Safety & Environment Group, Bhabha Atomic Research Centre, Mumbai, India

    D. K. Aswal PhD

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Aneja, Y., Thakran, M., Sharma, A.K., Rawat, H.S., Dubey, S.K. (2023). Quantum Microwave Measurements. In: Aswal, D.K., Yadav, S., Takatsuji, T., Rachakonda, P., Kumar, H. (eds) Handbook of Metrology and Applications. Springer, Singapore. https://doi.org/10.1007/978-981-19-1550-5_79-2

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  • DOI: https://doi.org/10.1007/978-981-19-1550-5_79-2

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Chapter history

  1. Latest

    Quantum Microwave Measurements
    Published:
    06 June 2023

    DOI: https://doi.org/10.1007/978-981-19-1550-5_79-2

  2. Original

    Quantum Microwave Measurements
    Published:
    29 March 2023

    DOI: https://doi.org/10.1007/978-981-19-1550-5_79-1

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