Breeding for Spot Blotch Resistance in Wheat

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New Horizons in Wheat and Barley Research

Abstract

Spot blotch is an important fungal disease caused by Bipolaris sorokiniana which affects wheat crop in South Asia and South America. This disease causes yield losses ranging from 15 to 25%. The disease also affects quality of harvested wheat grains. The chief symptoms of the disease include small, dark brown lesions ranging from 1 to 2 mm in length without chlorotic margin, and the lesions coalesce and induce the death of the leaf. Host resistance is recognized as an economical and eco-friendly approach of managing spot blotch, and the resistance is controlled by polygenes. A number of resistance sources have been identified and utilized in breeding varieties which were made available for cultivation. With the use of molecular marker technology and genome sequencing platforms some of the resistance genes have been identified and used in breeding using marker-assisted selection approach. This chapter focuses on the recent understanding of the genetics of resistance, identification, and map** of new sources and genes/QTLs and breeding efforts to develop new improved genotypes with better resistance against spot blotch to ensure food security in the world.

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Gupta, V., Sheoran, S., Singh, C., Tyagi, B.S., Singh, G.P., Singh, G. (2022). Breeding for Spot Blotch Resistance in Wheat. In: Kashyap, P.L., et al. New Horizons in Wheat and Barley Research . Springer, Singapore. https://doi.org/10.1007/978-981-16-4449-8_13

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