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The Advancing Frontier in the Knowledge of the Structure of Interphases

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Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry

Part of the book series: NATO ASI Series ((ASIC,volume 320))

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Abstract

This is a comprehensive document about the structure of the double layer in electrochemical systems, which involves mainly the metal/ and semiconductor/solution interphases, as well as metal/moltensalt interphases. It begins with an account of the classical method of investigating interfaces, which appears to be no longer applicable. Among, topics discussed are the different models of water structure at the double layer, the various potentials in the interphaeial region, and ab-initla calculations.

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Author information

Authors and Affiliations

  1. Surface Electrochemistry Laboratory, Texas A&M University, College Station, Texas, 77843, USA

    J. O’M. Bockris & Anuncia Gonzalez-Martin

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  1. J. O’M. Bockris
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  2. Anuncia Gonzalez-Martin
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Editors and Affiliations

  1. Instituto de Química Física “Rocasolano”, C.S.I.C., Madrid, Spain

    C. Gutiérrez

  2. Argonne National Laboratory, Argonne, Illinois, USA

    C. Melendres

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Bockris, J.O., Gonzalez-Martin, A. (1990). The Advancing Frontier in the Knowledge of the Structure of Interphases. In: Gutiérrez, C., Melendres, C. (eds) Spectroscopic and Diffraction Techniques in Interfacial Electrochemistry. NATO ASI Series, vol 320. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-3782-9_1

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  • DOI: https://doi.org/10.1007/978-94-011-3782-9_1

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-5684-7

  • Online ISBN: 978-94-011-3782-9

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