Abstract
High resolution microscopy techniques have been used to study fundamental problems related to the improvement of permanent magnets, to quantify interfacial roughness of layered structures, and to determine the decomposition behavior of heterogeneous alloys. The microstructural information obtained provides data for correlation with the relevant magnetic data and, hence, considerable insight into materials behavior, aiding in the understanding and improvement of materials performance.
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Huetten, A., Thomas, G. (1994). High Resolution Microscopy Characterization of Nanostructured Materials. In: Hadjipanayis, G.C., Siegel, R.W. (eds) Nanophase Materials. NATO ASI Series, vol 260. Springer, Dordrecht. https://doi.org/10.1007/978-94-011-1076-1_23
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DOI: https://doi.org/10.1007/978-94-011-1076-1_23
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