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Near Field Optics and Scanning Near Field Optical Microscopy

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Quantum Optics of Confined Systems

Part of the book series: NATO ASI Series ((NSSE,volume 314))

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Abstract

By near field optics the diffraction limit of light microscopy can be avoided. Contact imaging by energy transfer is a simple scheme to achieve this goal. Scanning Near Field Optical Microscopy (SNOM) using a tapered metal coated fibre with an aperture at the tip seems to reach a resolution limit at 30 nm. Alternative probes offer the opportunity to extend the resolution to the nm range. The concept of the tetrahedral tip as an efficient SNOM probe and its performance in a hybrid SNOM/STM (Scanning Tunneling Microscope) mode is described, where optical images of 6 nm resolution can be obtained.

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Authors and Affiliations

  1. Physikalisches Institut, Westfälische Wilhelms- Universität, Wilhelm Klemmstr. 10, 48149, Münster, Germany

    U. C. Fischer, J. Koglin, A. Naber, A. Raschewski, R. Tiemann & H. Fuchs

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  1. U. C. Fischer
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  2. J. Koglin
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  3. A. Naber
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  4. A. Raschewski
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  5. R. Tiemann
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  6. H. Fuchs
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Editors and Affiliations

  1. Laboratoire de Physique des Lasers, Institut Galilée, Université Paris-Nord, Villetaneuse, France

    Martial Ducloy  & Daniel Bloch  & 

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© 1996 Kluwer Academic Publishers

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Fischer, U.C., Koglin, J., Naber, A., Raschewski, A., Tiemann, R., Fuchs, H. (1996). Near Field Optics and Scanning Near Field Optical Microscopy. In: Ducloy, M., Bloch, D. (eds) Quantum Optics of Confined Systems. NATO ASI Series, vol 314. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-1657-9_9

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  • DOI: https://doi.org/10.1007/978-94-009-1657-9_9

  • Publisher Name: Springer, Dordrecht

  • Print ISBN: 978-94-010-7241-0

  • Online ISBN: 978-94-009-1657-9

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