Abstract
Overview of the main directions of electron microscopy and the requirements for the samples to be examined. Presentation of transmission electron microscopy (TEM) including ultrahigh-voltage TEM, ultrahigh-resolution TEM and analytical TEM, the techniques of scanning electron microscopy (SEM), emission electron microscopy and scanning probe microscopy, each with a description of the formation of contrast in the images and illustrated by characteristic image examples. A note on in-situ microscopy concludes the chapter.
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Notes
- 1.
The crazes are local deformation zones of several 100 nm thickness and several μm length, which essentially cause the fracture toughness.
- 2.
Dislocations are lineal crystal defects and carriers of plastic deformation of crystals.
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Michler, G.H. (2023). Directions of Electron Microscopy. In: Compact Introduction to Electron Microscopy. essentials. Springer, Wiesbaden. https://doi.org/10.1007/978-3-658-37364-1_2
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