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Light Emission from Nominally Smooth and Statistically Rough Ag Tunnel Junctions

  • Conference paper
Electromagnetic Surface Excitations

Part of the book series: Springer Series on Wave Phenomena ((SSWAV,volume 3))

  • 222 Accesses

Abstract

Light emission from both nominally smooth Aℓ-Aℓ 203−Ag tunnel junctions and statistically rough CaF2-Aℓ-Aℓ 203 − Ag tunnel junctions under high values of applied bias (>4V) is observed.

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Author information

Authors and Affiliations

  1. Physics Department, University of Ulster, Coleraine, N. Ireland, BT52 1SA

    P. Dawson & D. G. Walmsley

Authors
  1. P. Dawson
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  2. D. G. Walmsley
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Editor information

Editors and Affiliations

  1. Department of Physics, University of California, Irvine, CA, 92717, USA

    Richard F. Wallis

  2. Optical Sciences Center, University of Arizona, Tucson, AZ, 85721, USA

    George I. Stegeman

  3. 981 East Lawn Drive, Teaneck, NJ, 07666, USA

    Theodor Tamir Ph. D.

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© 1986 Springer-Verlag Berlin Heidelberg

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Dawson, P., Walmsley, D.G. (1986). Light Emission from Nominally Smooth and Statistically Rough Ag Tunnel Junctions. In: Wallis, R.F., Stegeman, G.I., Tamir, T. (eds) Electromagnetic Surface Excitations. Springer Series on Wave Phenomena, vol 3. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82715-0_13

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  • DOI: https://doi.org/10.1007/978-3-642-82715-0_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82717-4

  • Online ISBN: 978-3-642-82715-0

  • eBook Packages: Springer Book Archive

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