Abstract
Companies incur huge costs in filing and defending patent lawsuits. A part of the problem arises from the fact that companies do not have a comprehensive understanding of the patents that they have cited and the patents that have cited their patents. By empirically analyzing the forward and backward citations of a set of litigated patents in the smart phone industry, we provide a method for profiling patents and identifying citation patterns. Our results show that while some patents share common forward and backward citations, others do not share any backward citations but share a lot of forward citations. We hypothesize that this maybe an indication of the convergence of different types of technologies. We also propose a new metric - Technology Overlap Factor - that can help in identifying convergence. In doing so, we provide a preliminary framework for further investigation and for building a patent analysis software system.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Breitzman, A.F., Mogee, M.E.: The many applications of patent analysis. Journal of Information Science 28(3), 187–205 (2002)
Fleming, J.: Valuing Patents: Assessing the Merit of Patent Citation Analysis. Undergraduate thesis. University of Virginia (2003)
Shaffer, M.J.: Entrepreneurial Innovation: Patent Rank and Marketing Science. Washington State University (2011)
Breitzman, A., Thomas, P.: Using Patent Citation Analysis to Target/Value Mergers and Acquisitions Candidates. Research-Technology Management 45, 28–29 (2002)
Brinn, M.W., Fleming, J.M., Hannaka, F.M., Thomas, C.B., Beling, P.A.: Investigation of forward citation count as a patent analysis method. In: 2003 IEEE Systems and Information Engineering Design Symposium, pp. 1–6 (2003)
Choi, C., Shin, J., Yoon, B., Lee, W., Park, Y.: On the linkage between industries and technologies: patent citation analysis. In: Proceedings of 2004 IEEE International Engineering Management Conference, vol. 2, pp. 576–578 (2004)
Wu, H.C., Chen, H.Y., Lee, K.Y., Liu, Y.C.: A method for assessing patent similarity using direct and indirect citation links. In: 2010 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), pp. 149–152 (2010)
Kim, Y.G., Suh, J.H., Park, S.C.: Visualization of patent analysis for emerging technology. Expert Systems with Applications 34, 1804–1812 (2008)
Daim, T.U., Rueda, G., Martin, H., Gerdsri, P.: Forecasting emerging technologies: Use of bibliometrics and patent analysis. Technological Forecasting and Social Change 73, 981–1012 (2006)
Karvonen, M., Kässi, T.: Patent analysis for analysing technological convergence. Foresight 13(5), 34–50 (2011)
Chien, C.V.: Predicting Patent Litigation. Texas Law Review 90, 283 (2011); Santa Clara Univ. Legal Studies Research Paper No. 17-11. SSRN, http://ssrn.com/abstract=1911579
Delaney, T.Q., Pioli, J.: Navigating Recent Mobile Patent Lawsuits. Aspatore, Boston (2011)
Fighting the Smart Phone Wars. World Intellectual Property Review, pp. 12–19 (March 2011)
Hall, B.H., Ziedonis, R.H.: The Patent Paradox Revisited: An Empirical Study of Patenting in the U.S. Semiconductor Industry, 1979-1995. RAND Journal of Economics 32(1), 101–128 (2001)
Hall, B.H., Ziedonis, R.: An empirical analysis of patent litigation in the semiconductor industry. University of California at Berkeley working paper (2007)
Hynes, J., Sinnott, T.: The US International Trade Commission: smartphone patent battles. Intellectural Property Magazine 39 (February 2011)
Lloyd, M., Spielthenner, D., Mokdsi, G.: The SmartPhone Patent Wars. IAM Journal, March 1-30 (2011)
Ziedonis, R.H.: Don’t Fence Me In: Fragmented Markets for Technology and Patent Acquisition Strategies of Firms. Management Science 50(6), 804–820 (2004)
IPISC, from AIPLA Survey (2011), http://www.patentinsurance.com/iprisk/aipla-survey/ (retrieved December 2, 2011)
Black, E.: from CCIA (July 16, 2009), http://www.ccianet.org/CCIA/files/ccLibraryFiles/Filename/000000000226/Ltr%20on%20Rpt%20SCP-13-51.pdf (retrieved December 2, 2011)
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2012 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Velichety, S., Ram, S. (2012). Common Citation Analysis and Technology Overlap Factor: An Empirical Investigation of Litigated Patents Using Network Analysis. In: Peffers, K., Rothenberger, M., Kuechler, B. (eds) Design Science Research in Information Systems. Advances in Theory and Practice. DESRIST 2012. Lecture Notes in Computer Science, vol 7286. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-29863-9_21
Download citation
DOI: https://doi.org/10.1007/978-3-642-29863-9_21
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-29862-2
Online ISBN: 978-3-642-29863-9
eBook Packages: Computer ScienceComputer Science (R0)