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XRF-Basics

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Laboratory Micro-X-Ray Fluorescence Spectroscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 55))

Abstract

This chapter describes the main interactions of X-rays with matter and how these can be used for the characterization of material. Such interactions are absorption, emission of fluorescence (or secondary) radiation, refraction, scattering and diffraction. This discussion will be limited because there are several papers and even monographs which describe these interactions very detailed. An overview of the main components of an X-ray spectrometer with their expected functionality is provided at the end of the chapter.

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  1. Eggersdorf, Germany

    Michael Haschke

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  1. Michael Haschke
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Haschke, M. (2014). XRF-Basics. In: Laboratory Micro-X-Ray Fluorescence Spectroscopy. Springer Series in Surface Sciences, vol 55. Springer, Cham. https://doi.org/10.1007/978-3-319-04864-2_1

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