Abstract
The detection and localization of possible diseases in crops are usually automated by resorting to supervised deep learning approaches. In this work, we tackle these goals with unsupervised models, by applying three different types of autoencoders to a specific open-source dataset of healthy and unhealthy pepper and cherry leaf images. CAE, CVAE and VQ-VAE autoencoders are deployed to screen unlabeled images of such a dataset, and compared in terms of image reconstruction, anomaly removal, detection and localization. The vector-quantized variational architecture turns out to be the best performing one with respect to all these targets.
This manuscript has been authored in part by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).
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Notes
- 1.
The image flip** around the vertical axis is also known as flop**.
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Acknowledgements
Massimiliano Lupo Pasini thanks Dr. Vladimir Protopopescu for his valuable feedback in the preparation of this manuscript. Massimiliano Lupo Pasini’s work was supported in part by the Artificial Intelligence Initiative as part of the Laboratory Directed Research and Development (LDRD) Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the US Department of Energy under contract DE-AC05-00OR22725. Simona Perotto and Nicola Ferro acknowledge the support by MUR, grant Dipartimento di Eccellenza 2023–2027.
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Calabrò, D., Pasini, M.L., Ferro, N., Perotto, S. (2024). A Deep Learning Approach for Detection and Localization of Leaf Anomalies. In: Rozza, G., Stabile, G., Gunzburger, M., D'Elia, M. (eds) Reduction, Approximation, Machine Learning, Surrogates, Emulators and Simulators. Lecture Notes in Computational Science and Engineering, vol 151. Springer, Cham. https://doi.org/10.1007/978-3-031-55060-7_3
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