Abstract
The discovery of the positron as an antielectron allows the development of many experimental techniques for studying matter at the atomic level. Initially, the band electronic structure was studied, then molecular structures as a result of the formation of a positron and electron bound state there. Wide application has been obtained for the detection of atomic defects. The book points to yet another application of positron techniques, i.e. the study of defect profiles near the surface. The book is intended as an introduction for students and people wanting to learn the basics of annihilation spectroscopy, but primarily as an overview of experimental techniques used to detect defect depth profiles. This is illustrated by many examples. With lots of helpful information, data tables, and valuable formulas, the book can also be of help to specialists in the field of annihilation spectroscopy.
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Dryzek, J. (2023). Introduction. In: Positron Profilometry. SpringerBriefs in Materials. Springer, Cham. https://doi.org/10.1007/978-3-031-41093-2_1
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DOI: https://doi.org/10.1007/978-3-031-41093-2_1
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