Abstract
This chapter is dedicated to yield (or failure probability) estimation. First, the yield is introduced formally and an overview of existing approaches for yield estimation is provided. Then, we propose two new hybrid methods for efficient yield estimation. One of them is based on SC, the other one on GPR. The aim of these methods is to maintain the high estimation accuracy achieved with classic MC, while the computational effort is reduced by evaluating most of the sample points on surrogate models. The content and structure of this chapter follow our work in [1, 2].
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Fuhrländer, M. (2023). Yield Estimation. In: Design Methods for Reducing Failure Probabilities with Examples from Electrical Engineering. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-031-37019-9_4
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DOI: https://doi.org/10.1007/978-3-031-37019-9_4
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