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Geometrical, Microstructural, and Chemical Characterization

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Component Surfaces

Part of the book series: Springer Series in Advanced Manufacturing ((SSAM))

Abstract

The chapter presents work on the geometric, structural, and chemical analysis of microscale surface structures. In the first part, the focus is on the technical and methodological developments themselves. Techniques as well as technical and methodological developments for the geometric characterization of surfaces, including the associated measuring instruments, data evaluation, and the characterization methods, are discussed. Furthermore, some special methods for the microstructural analysis of surface morphologies, in particular, with optical methods and by means of X-ray diffraction, are presented. The second part of this chapter deals with the application of microscopic, spectroscopic, and mass spectrometric techniques to characterize surfaces subjected to friction and wear. It is shown which information can be obtained with the methods mentioned and it is shown exemplarily how, on the one hand, technologies that have been developed for analysis can be used to generate defined surface structures. On the other hand, special microscopic surface structures have been developed that can also be used beneficially for the investigation of tribological processes.

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Author information

Authors and Affiliations

  1. Institute of Surface and Thin Film Analysis (IFOS), Kaiserslautern, Germany

    Michael Kopnarski

  2. Institute of Materials Science and Engineering, RPTU Kaiserslautern, Kaiserslautern, Germany

    Tilmann Beck & Marek Smaga

  3. Institute of Materials Testing, RPTU Kaiserslautern, Kaiserslautern, Germany

    Stella Diederichs & Eberhard Kerscher

  4. Institute of Measurement and Sensor Technology, RPTU Kaiserslautern, Kaiserslautern, Germany

    Jörg Seewig

Authors
  1. Michael Kopnarski
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  2. Tilmann Beck
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  3. Stella Diederichs
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  4. Eberhard Kerscher
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  5. Jörg Seewig
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  6. Marek Smaga
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Corresponding author

Correspondence to Michael Kopnarski .

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Editors and Affiliations

  1. Institute of Manufacturing Technology and Production Systems, RPTU Kaiserslautern, Kaiserslautern, Germany

    Jan C. Aurich

  2. Institute of Engineering Thermodynamics, RPTU Kaiserslautern, Kaiserslautern, Germany

    Hans Hasse

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Kopnarski, M., Beck, T., Diederichs, S., Kerscher, E., Seewig, J., Smaga, M. (2024). Geometrical, Microstructural, and Chemical Characterization. In: Aurich, J.C., Hasse, H. (eds) Component Surfaces. Springer Series in Advanced Manufacturing. Springer, Cham. https://doi.org/10.1007/978-3-031-35575-2_2

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  • DOI: https://doi.org/10.1007/978-3-031-35575-2_2

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