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Atomic Force Microscopy: An Advanced Imaging Technique—From Molecules to Morphologies

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Microscopic Techniques for the Non-Expert

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Abstract

Atomic force microscopy (AFM) is an extensively used advanced characterization technique for a nanoscale range of materials. This chapter clearly describes the importance and advantages of AFM, its working principles, modes of measurement, and its applications in interdisciplinary fields such as chemistry, materials science, and biology.

The authors Jeevan Kumar Reddy Modigunta and Selvamani Vadivel both contribute equally.

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Acknowledgments

This research was supported by the Radiation Technology R&D program (NRF-2017M2A2A6A01019289), funded by the Ministry of Science, ICT and Future Planning. This research was supported by the Basic Science Research Program through the National Research Foundation of Korea (NRF), funded by the Ministry of Education (2018R1A6A1A03023788 and 2021R1I1A1A01055790). Additionally, this work was supported by the Korea Institute for Advancement of Technology (KIAT) grant funded by the Korean Government (MOTIE) (P00008500, The Competency Development Program for Industry Specialist). This work was supported by the Material Components Global Investment Linkage Technology Development Project (Global Open Technology Development Project) (20013593) of the KEIT, MOTIE (KOREA).

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    Authors and Affiliations

    1. Department of Polymer Science and Engineering, Department of IT-Energy Convergence (BK21 FOUR), Chemical Industry Institute, Korea National University of Transportation, Chungju, South Korea

      Jeevan Kumar Reddy Modigunta, G. Murali & Insik In

    2. Department of Chemical and Biomolecular Engineering, School of Energy Science and Engineering, Centre of Excellence for Energy Storage Technology, Vidyasirimedhi Institute of Science and Technology, Rayong, Thailand

      Selvamani Vadivel & Montree Sawangphruk

    Authors
    1. Jeevan Kumar Reddy Modigunta
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    2. Selvamani Vadivel
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    3. G. Murali
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    4. Insik In
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    5. Montree Sawangphruk
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    Corresponding author

    Correspondence to Jeevan Kumar Reddy Modigunta .

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    Editors and Affiliations

    1. Departamento de Ingeniería, Instituto Tecnológico El Llano Aguascalientes (ITEL)/Tecnológico Nacional de México (TecNM), Aguascalientes, Mexico

      Sathish-Kumar Kamaraj

    2. Sede Vallenar, Universidad de Atacama, Vallenar, Chile

      Arun Thirumurugan

    3. School of Engineering, RMIT University, Melbourne, VIC, Australia

      Shanmuga Sundar Dhanabalan

    4. Institute of Physics, Pontifical Catholic University of Chile, Casilla 306, RM - Santiago, Chile

      Samuel A. Hevia

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    Modigunta, J.K.R., Vadivel, S., Murali, G., In, I., Sawangphruk, M. (2022). Atomic Force Microscopy: An Advanced Imaging Technique—From Molecules to Morphologies. In: Kamaraj, SK., Thirumurugan, A., Dhanabalan, S.S., Hevia, S.A. (eds) Microscopic Techniques for the Non-Expert. Springer, Cham. https://doi.org/10.1007/978-3-030-99542-3_5

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