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Spectroscopic Analysis of Plasma Modified Polymer Surfaces

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Plasma Modification of Polyolefins

Part of the book series: Engineering Materials ((ENG.MAT.))

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Abstract

The surface properties of polymers are essential for various industrial applications. Spectroscopy techniques like Fourier-transform infrared spectroscopy (FTIR), secondary mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), and nuclear magnetic resonance spectroscopy (NMR) are the most prominent for plasma modified polyolefin surface analysis. This book chapter provides a brief introduction to the principles of these spectroscopy methods, their uniqueness, usability, and limitations. The application of FTIR, SIMS, XPS, and NMR to the study of the surface physical and chemical properties of plasma modified polyolefins are described. Particular emphasis is devoted to the challenges arising from the chemical structure of polyolefins and handling the analysis.

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Authors and Affiliations

  1. Department of Applied Physics, Ghent University, 9000, Ghent, Belgium

    Yuliia Onyshchenko, Ke Vin Chan, Nathalie De Geyter & Rino Morent

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  1. Yuliia Onyshchenko
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  2. Ke Vin Chan
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  3. Nathalie De Geyter
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  4. Rino Morent
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Correspondence to Yuliia Onyshchenko or Rino Morent .

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Editors and Affiliations

  1. Department of Polymer Science and Rubber Technology, Cochin University of Science and Technology, Kerala, Kerala, India

    N. S. Baneesh

  2. Department of Polymer Science and Rubber Technology, Cochin University of Science and Technology, Kerala, Kerala, India

    P. S. Sari

  3. Department of Materials Engineering, Czech Technical University in Prague, Praha 2, Czech Republic

    Tatana Vackova

  4. School of Energy Materials, Mahatma Gandhi University, Kottayam, Kerala, India

    Sabu Thomas

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Onyshchenko, Y., Chan, K.V., De Geyter, N., Morent, R. (2022). Spectroscopic Analysis of Plasma Modified Polymer Surfaces. In: Baneesh, N.S., Sari, P.S., Vackova, T., Thomas, S. (eds) Plasma Modification of Polyolefins. Engineering Materials. Springer, Cham. https://doi.org/10.1007/978-3-030-52264-3_6

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