Abstract
Graphite exhibits a lamellar structure (Fig.1). The lattice consists of oexagonal carbon monolayers separated by an interplanar spacing (d=3.35Å) much larger than the in-plane nearest neighbour distance (b=1.42Å). The weak interlayor interactions allow the intercalation of a wide diversity of atomic and molecular species between the carbon layers. Graphite Intercalation Compounds (GIC) are characterized by the existence of stage ordering: a periodic sequence of n graphite layers and an intercalated layer, with n defining the stage of the compound [1–11].
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References
A. Herold: In Physics and Chemistry of Materials with Layered Structures, ed. by F.A. Levy, D. Reidel (Dordrecht 1979), Vol.6 (Intercalated Layered Materials), p.323
J.E. Fischer: In Physics and Chemistry of Materials with Layered Structures, ed. by F.A. Levy, D. Reidel (Dordrecht 1979, Vol.6 [Intercalated Layered Materials), p.383
S.A. Solin: In Advances in Chemical Physics
P. Pfluger and H.H. Gunterodt: In Advances in Solid State Physics Vol.21 (Vieweg, Braunsweig 1981)
M.S. Dresselhaus and G. Dresselhaus: In Adv. Phys. 30, 139 (1981).
Proceedings Franco-American Conference on Intercalation Compounds of Graphite (La Napoule, France), Mat. Sci. Eng. 31 (1977)
Proceedings of the International Conference on layered Materials and Intercalated (Nijmegen, The Netherlands), Physica 99B (1980)
E. Proceedings of the Second International Conference on Intercalation Compounds of Graphite (Provincetown, Mass., USA), Synthetic Metals 2/3 (1980/1981)
Ptroceedings of the Third International Conference on Intercalation Compounds of Graphite (Pont-à-Mousson, France), Synthetic Metals 8 (1983)
Proceedings of the Fourth International Conference on Intercalation Compounds of Graphite (Tsukuba, Japan), Synthetic Metals 12 (1986)
Proceedings of the French-Japanese Symposium on Graphite Intercalation Compounds (Paris, France), Annales de Physique N°2 (Supp1.2) 11 (1986)
M. Zanini and J.E. Fischer: In Ref.[6], p.169
P.R. Wallace: In Phys. Rev. 71, 622 (1947)
G.S. Painter and D.E. Ellis: In Phys. Rev. 81, 4747 (1970)
M. Tsukada, K. Nakao, Y. Uemura and S. Nagai: in Journ. Phys. Soc. Jap. 32, 54 (1972)
J. Blinowski, Nguyen Hy Hau, C. Rigaux, J.P. Vieren, R. Le Toullec, G. Furdin, A. Herold, J. Melin: In Journal Physique (Faris) 41, 47 (1981)
J.C. Slonczewski and P.R. Weiss: In Phys. Rev. 109, 272 (1958)
J.N. McClure: In Phys. Rev. 108, 612 (1957)
A. Zunger: In Phys. Rev. 817, 626 (1978)
R.C. Tatar and S. Rabii: In Phys. Rev. 825 4126 (1982)
I.L. Spain: In Proceedings of the International Conference on Semi-metals and Narrowgap Semiconductors (Pergamon Press, New York 1973), p.177, and in Chemistry and Physics of Carbon, ed. by P.L. Walker (New York:Marcel Dekker), Vol. 8, p. 105
N.A.W. Holtzwarth, L.A. Girifalco and S. Rabii: In Phys. Rev. 818, 5190 (1978) and in Phys. Rev. 818, 5206 (1978)
T. Ohno, K. Nakao, H. Kamimura: In J. Phys. Soc. Jap. 47, 1125 (1979), and H. Kamimura: In Ref.[11], p.39
T. Inoshita, K. Nakao and H. Kamimura: In J. Phys. Soc. Jap. 43, 2137 (1977)
D.P.DiVicenzo and S. Rabii: In Ref.[7], p.406, and in Phys. Rev. 825, 4110 (1982)
T.C. Tatar: In Ph. D. Thesis (University of Pennsylvania, USA,1985)
G. Dresselhauss and S.Y. Leung: In Phys. Rev. 824, 3490 (1981)
W.D. Ellenson, D. Semmingson and J.E. Fischer: In Mat. Sci. Eng. 31 (1977)
G.S. Parry and D.E. Nixon: In J. Phys. C 2, 2156 (1969)
N.A.W. Holtzwarth: In Phys. Rev. B21, 3665 (1980)
L. Pietronero, S. Strassier, H.K. Zeller and M.J. Rice: In Phys. Rev. Lett. 41, 763 (1978), and in Sol. St. Comm. 10, 399 (1979)
J. Blinowski and C. Rigaux: In Journ. Physique (Faris) 41, 667 (1980), and in Ref.[8], p.297
S.A. Safran and D.R. Hamann: In Phys. Rev. B22, 3490 (1981), and in Phys. Rev. B23, 565 (1981), and in Ref.[p.1
S. Shimamura and A. Morita: Ln J. Phys. Soc. Jap. 51, 502 (1982)
T. Ohno and H. Kamimura: In J. Phys. Soc. Jap. 52, 223 (1983), and in Ref.[11], p.179
D.L. Greenaway, G. Harbeke, F. Bassani and E. Tosatti: In Phys. Rev. 178, 1340 (1969)
M.S. Dresselhaus, G. Dresselhaus and S.E. Fischer: In Phys. Rev. B15, 3180 (1977)
P.R. Hanlon, E.R. Falardeau, D. Guerard, J.E. Fischer: Ir Mat. Sci. Eng. 31, 161 (1 977), and in Sol. St. Comm. 377 (1 977)
M. Saint Jean, Nguyen Hy Hau, C. Rigaux, G. Furdin: In Sol. St. Comm. 46, 55 (1983)
T.E. Thompson, E.R. Falardeau and L.R. Hannon: In Carbon 15, 39 (1977)
Nguyen Hy Hau, J. Blinowski, C. Rigaux, R. Le Toullec, G. Furdin, A. Herold, R. Vangelisti: In Synth. Metals 3, 99 (1981)
J. Blinowski, Nguyen Hy Hau, C. Rigaux, J.P. Vieren: In J. Phys. Soc. Jap. 49, Suppla, 915 (1980)(15th Intern. Conf. Phys. Semicond.)
C. Rigaux and J. Blinowski: In Physics of Narrow Gap Semiconductors (4 Intern. Conf.), p.352, Lecture Notes in Physics N°152 (Springer, Beriin 1982)
P.C. Eklund, D.S. Smith and V.R.K. Murthy: In Synth. Metals 3, 111 (1981)
D,M.Hoffman, R.E. Heinz, G.L. Doll and P.C. Eklund: In Fhys. Rev. 332, 1278 (1985)
D.M. Hoffman, P.C. Eklund, R.E. Heins, P. Hawrylak and K.o. Subbaswamy! In Phys. Rev. 831, 3973 (1985)
J.E. Fischer, T.E. Thompson, G.M.T. Foley, D. Guerard, M. Hoke and F.L. Lederman: In P:tys. Rev. Lett. 37, 769 (1976)
C.C. Shieh, R.L. Schmidt and J.E. Fischer: In Phys, Rev. B20, 3351 (1979)
M. Saint Jean, M. Menant, Nguyen Hy Hau, C. Rigaux, A. Metrot: In Synth. Metals 8, 189 (1985)
M. Saint Jean: in Thesis (Paris 1983)
J.M. Mang, D.U. Hoffman and P.C. Eklund: In Plays. Rev. B (in press)
E.A. Taft and H.R. Philipp: In Phys, Rev. 138, A197 (1965)
F. Bassani, G. Fastori-Parravicini: In Nuovo Cimento 50E, 95 (1967)
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Rigaux, C. (1986). Electronic Structure and Optical Properties. In: Dresselhaus, M.S. (eds) Intercalation in Layered Materials. NATO ASI Series, vol 148. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-5556-5_19
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