X-ray and Neutron Scattering Studies of Graphite Intercalated with Two-Dimensional K-NH3 Metal-Ammonia Solutions

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Disordered Semiconductors

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Abstract

The potassium-ammonia ternary graphite intercalation compounds (T GIC’s) K(NH3)xC24, 0 ≤ × ≤ 1, and their deuterated counterparts have been of considerable recent interest. 1–3 This interest results from the possibility that the intercalant layers in these compounds may be the 2-dimensional (2D) structural and electrical analogue of the corresponding bulk 3-dimensional (3D) metal ammonia solutions which are renowned for the metal-insulator (MI) transition which they exhibit.4 Indeed, recent electrical resistivity and optical reflectivity5 measurements of the potassium-ammonia T GIC’s do indeed indicate that the intercalant layer undergoes an MI transition at a value of x ~ 4.0 corresponding to complete solvation of the potassium ions by 4-fold coordinated ammonia molecules3.

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References

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© 1987 Plenum Press, New York

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Solin, S.A. (1987). X-ray and Neutron Scattering Studies of Graphite Intercalated with Two-Dimensional K-NH3 Metal-Ammonia Solutions. In: Kastner, M.A., Thomas, G.A., Ovshinsky, S.R. (eds) Disordered Semiconductors. Institute for Amorphous Studies Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-1841-5_15

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  • DOI: https://doi.org/10.1007/978-1-4613-1841-5_15

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4612-9028-5

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