Abstract
The determination of the exact values of (n,m) or equivalently (d, ϑ)for an individual singlewall nanotube (SWNT) is of great importance, in particular for comparison with transport measurements. In this study, the selected area electron diffraction technique is used to investigate the structure of individual carbon nanotubes grown by chemical vapor deposition (CVD) directly on TEM-Si3N4 membranes.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Similar content being viewed by others
References
R. Saito, G. Dresselhaus, and M. S. Dresselhaus, Physical properties of carbon nanotubes (Imperial College Press, London, 1998).
J. W. Mintmire and C. T. White, Electronic and structural properties of carbon nanotubes, Carbon 33, 893–902 (1995).
M. Gao, M. Zuo, R. D. Twesten, I. Petrov, L. A. Nagahara, and R. Zhang, Structure determination of individual single-wall carbon nanotubes by nanoarea electron diffraction, Appl. Phys. Lett. 82, 2703–2705 (2003).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2006 Springer
About this paper
Cite this paper
THUNE, E. et al. (2006). STRUCTURAL DETERMINATION OF INDIVIDUAL SINGLEWALL CARBON NANOTUBE BY NANOAREA ELECTRON DIFFRACTION. In: Popov, V.N., Lambin, P. (eds) Carbon Nanotubes. NATO Science Series II: Mathematics, Physics and Chemistry, vol 222. Springer, Dordrecht. https://doi.org/10.1007/1-4020-4574-3_3
Download citation
DOI: https://doi.org/10.1007/1-4020-4574-3_3
Publisher Name: Springer, Dordrecht
Print ISBN: 978-1-4020-4572-1
Online ISBN: 978-1-4020-4574-5
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)