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Optical and thermal properties of V2O5 thin films with crystallization

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Abstract

In order to show the crystallization behavior for various substrate temperatures we grew V2O5 films at different temperatures using a radio frequency sputtering system. Spectroscopic ellipsometry and a thermo-reflectance method were used to investigate the optical and the thermal properties of V2O5 films with different crystallization structures. The transmission spectra and the n and the k spectra revealed changes over the entire measurement range. The optical properties of the V2O5 films were affected by variations in the crystalline structure. The thermal conductivities of the V2O5 films with amorphous and crystalline structures were 0.838 Wm−1K−1 and 1.749 Wm−1K−1, respectively, and the thermal conductivity depended on the crystallization of the film. Furthermore, the variation of the crystalline structure led to changes in the optical and the thermal properties.

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Authors and Affiliations

  1. Department of Physics, University of Ulsan, Ulsan, 680-190, Korea

    Manil Kang & Sok Won Kim

  2. Department of Physics, Kongju National University, Kongju, 314-701, Korea

    Ji-Wook Ryu

  3. Materials Database Station, National Institute for Materials Science, Tsukuba, 3050047, Japan

    Yibin Xu & Ryozo Kato

Authors
  1. Manil Kang
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  2. Sok Won Kim
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  3. Ji-Wook Ryu
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  4. Yibin Xu
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  5. Ryozo Kato
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Correspondence to Sok Won Kim.

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Kang, M., Kim, S.W., Ryu, JW. et al. Optical and thermal properties of V2O5 thin films with crystallization. Journal of the Korean Physical Society 62, 1134–1138 (2013). https://doi.org/10.3938/jkps.62.1134

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  • DOI: https://doi.org/10.3938/jkps.62.1134

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