References
J.A. Weil, J.R. Bolton, and J.E. Wertz, Electron Paramagnetic Resonance (John Wiley & Sons, New York, 1994).
J-M. Spaeth, J.R. Niklas, and R.H. Bartram, Structural Analysis of Point Defects in Solids (Springer-Verlag, Berlin, 1992).
M.H. Rakowsky, W.K. Kuhn, W.J. Lauderdale, L.E. Halliburton, G.J. Edwards, M.P. Scripsick, P.G. Schunemann, T.M. Pollak, M.C. Ohmer, and F.K. Hopkins, Appl. Phys. Lett. 64 (13) (1994) p. 1615.
L.E. Halliburton, G.J. Edwards, M.R. Scripsick, M.H. Rakowsky, R.G. Schunemann, and T.M. Pollak, Appl. Phys. Lett. 66 (20) (1995) p. 2670.
N.C. Giles, L.E. Halliburton, P.G. Schunemann, and T.M. Pollak, ibid. p. 1758.
S.D. Setzler, L.E. Halliburton, N.C. Giles, P.G. Schunemann, and T.M. Pollak, in Infrared Applications of Semiconductors-Materials, Processing, and Devices, edited by M.O. Manasreh, T.H. Myers, and F.H. Julien (Mater. Res. Soc. Symp. Proc. 450, Pittsburgh, 1997) p. 327.
K.T. Stevens, S.D. Setzler, L.E. Halliburton, N.C. Fernelius, P.G. Schunemann, and T. M. Pollak, inlnfrared Applications of Semiconductors II, edited by S. Sivananthan, M.O. Manasreh, R.H. Miles, and D.L. McDaniel, Jr. (Mater. Res. Soc. Symp. Proc. 484, Pittsburgh, 1998).
A. Kiel, Solid State Commun. 15 (1974) p. 1021.
P. Zapol, R. Pandey, M. Ohmer, and J. Gale, J. Appl. Phys. 79 (1996) p. 671.
V.N. Brudnyi, D.L. Budnitskii, M.A. Krivov, R.V. Masagutova, V.D. Prochukhan, and Yu.V. Rud, Phys. Status Solidi A 50 (1978) p. 379.
G.K. Averkieva, V.S. Grigoreva, I.A. Maltseva, V.D. Prochukhan, and Yu.V. Rud, ibid. 39 (1977) p. 453.
Yu.V. Rud, Semiconductors 28 (1994) p. 633.
J.E. McCrae, Jr., M.R. Gregg, R.L. Hengehold, Y.K. Yeo, P.H. Ostdiek, M.C. Ohmer, P.G. Schunemann, and T.M. Pollak, Appl. Phys. Lett. 64 (1994) p. 3142.
N. Dietz, I. Tsveybak, W. Ruderman, G. Wood, and K.J. Bachmann, ibid. 65 (1994) p. 2759.
N. Dietz, W. Busse, H.E. Gumlich, W. Ruderman, I. Tsveybak, G. Wood, and K.J. Bachmann, in Infrared Applications of Semiconductors-Materials, Processing, and Devices, edited by M.O. Manasreh, T.H. Myers, and F.H. Julien (Mater. Res. Soc. Symp. Proc. 450, Pittsburgh, 1997) p. 333.
Yu.V. Rud, V. Yu, M.C. Ohmer, and R.G. Schunemann, ibid. p. 339.
G.W. Iseler, H. Kildal, and N. Menyuk, J. Electron. Mater. 7 (1978) p. 737.
L.E. Halliburton, G.J. Edwards, P.G. Schunemann, and T.M. Pollak, J. Appl. Phys. 77 (1995) p. 435.
J.E. McCrae, R.L. Hengehold, Y.K. Yeo, M.C. Ohmer, and P.G. Schunemann, Appl Phys. Lett. 70 (1997) p. 455.
J.B. Aufgang, D. Labrie, K. Olson, B. Paton, A.M. Simpson, G.W. Iseler, and A. Borshchevsky, Semicond. Sci. Technol. 12 (1997) p. 1257
Rights and permissions
About this article
Cite this article
Giles, N.C., Halliburton, L.E. Native Defects in the Ternary Chalcopyrites. MRS Bulletin 23, 37–40 (1998). https://doi.org/10.1557/S0883769400029079
Published:
Issue Date:
DOI: https://doi.org/10.1557/S0883769400029079