SpringerLink
Log in

Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM

  • Published:
MRS Online Proceedings Library Aims and scope

Abstract

Ni/Ti multilayered thin films can be efficient neutron guides and are therefore of great interest in neutron optics. Ni/Ti and NiC/Ti multilayers with various layer thicknesses were fabricated by magnetron sputtering and characterized by high resolution transmission electron microscopy (TEM). The TEM studies, performed on cross-sectional specimens, revealed that both kinds of layers were textured and snowed coherence in the growth direction. The presence of a 2 nra thick amorphous zone at the Ni/Ti interface in the carbon free thin films was also confirmed. On the contrary, sharp interfaces were obtained in NiC/Ti multilayers. The fine structure of the different layers will also be reported.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price includes VAT (United Kingdom)

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. A. Sdaq, J.M. Broto, H. Rakoto, J.C. Ousset, B. Raquet, B. Vidal, Z. Jiang, J.F. Bobo, M. Piecuch and B. Baylac, J. Magn. Magn. Mater. 121, 409 (1993).

    Article  CAS  Google Scholar 

  2. B. M. Clemens, Phys. Rev. B 33, 7615 (1985).

    Article  Google Scholar 

  3. O. Elsenhans, P. Böni, H.P. Friedli, H. Grimmer, P. Buffat, K. Leifer and I. Anderson SPIE 1738, 130 (1992).

    CAS  Google Scholar 

  4. Z. Jiang, B. Vidal, M. Brunei, M. Maaza, F. Samuel, SPIE 1738, 141 (1992).

    CAS  Google Scholar 

  5. A.K. Petford-long, P.E. Donovan and A. Heys Ultramiscroscopy 47, 323 (1992)

    Article  CAS  Google Scholar 

  6. M. Porte, H. Lassri, R. Krishnan, M. Kaabouchi, M. Mâaza and C. Sella, Appl. Surf. Science 65-66, 131 (1993)

    Article  CAS  Google Scholar 

  7. S. Sella, M. Maaza, M. Kaabouchi, S. El Monkade, M. Miloche and H. Lassri, J. Magn. Magn. Mat. 121, 201 (1993).

    Article  CAS  Google Scholar 

  8. G.A. Bertero, T.C. Hufnagel, B.M. Clemens and R. Sinclair, J. Mater. Res. 8, 771 (1993).

    Article  CAS  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Cemes - Loe, CNRS, B.P. 4347, 31055, Toulouse cedex, France

    M. J. Casanove, E. Snoeck & C. Roucau

  2. Department of Materials, University of Oxford, Parks Road, Oxford, OX 1 3PH, UK

    J. L. Hutci-Ison

  3. Faculté des Sciences de St. Jérôme, 13397, Marseille cedex, France

    Z. Jiang & B. Vidal

Authors
  1. M. J. Casanove
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. E. Snoeck
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. C. Roucau
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. J. L. Hutci-Ison
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Z. Jiang
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. B. Vidal
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Casanove, M.J., Snoeck, E., Roucau, C. et al. Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM. MRS Online Proceedings Library 343, 277–282 (1994). https://doi.org/10.1557/PROC-343-277

Download citation

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1557/PROC-343-277

Search

Navigation