Abstract
Our present knowledge on self-interstitials in silicon and the rôle these defects play under widely different experimental conditions are surveyed. In particular, the following phenomena involving self-interstitials either in supersaturations or under high-temperature thermal-equilibrium conditions are considered: mobility-enhanced diffusion of self-interstitials below liquid-helium temperature, thermally activated diffusion of self-interstitials at inter-mediate temperatures (14O K to 600 K), concentration-enhanced diffusion of Group-III or Group-V elements in silicon at higher temperatures, and— as examples for high-temperature equilibrium phenomena — self-diffusion and diffusion of gold in silicon. This leads to the picture that the self-interstitials in silicon may occur in different electrical charge states and possess dumbbell configurations or are extended over several atomic volumes at intermediate or high temperatures, respectively.
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References
G. D. Watkins, in: Radiation Damage in Semiconductors, P. Baruch ed. (Dunod, Paris 1964) p. 97.
G. D. Watkins, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, p. 1.
K. L. Brower, Phys. Rev. B 1, 1908 (1970).
R. E. McKeighen and J. S. Koehler, Phys. Rev. B 4, 462 (1971).
P. S. Gwozdz and J. S. Koehler, Bull. Am. Phys. Soc. 17, 307 (1972).
J. Arimura and J. W. MacKay, in: Radiation Effects in Semiconductors, F. L. Vook ed. (Plenum Press, New York 1968) p. 204.
W.D. Hyatt and J. S. Koehler, Phys. Rev. B 4, 1903 (1971).
A. Seeger and K.P. Chik, phys. stat. sol. 29, 455 (1968).
A. Seeger, Rad. Effects 9, 15 (1971).
A. Seeger and W. Frank, in: Radiation Damage and Defects in Semiconductors, J. E. Whitehouse ed. (Institute of Physics, London and Bristol 1972) p. 262.
W. Frank, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, p. 23.
A. Seeger, H. Föll, and W. Frank, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institute of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 12.
A. Seeger, W. Frank, and U. Gösele, in: Defects and Rad. Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 148.
H. M. James and K. Lark-Horovitz, Z. Phys. Chem. (Leipzig) 198, 107 (1951).
E. I. Blount, J. Appl. Phys. 30, 1218 (1959).
G. D. Watkins, R. P. Messmer, C. Weigel, D. Peak, and J. W. Corbett, Phys. Rev. Lett. 27, 1573 (1971).
G. Hettich, H. Mehrer, and K. Maier, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 500.
G. L. McVay and A. R. DuCharme, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, Bristol and London 1975), Inst. Phys. Conf. Ser. No. 23, p. 91.
D. Shaw, phys. stat. sol. (b) 72, 11 (1975).
J. A. van Vechten and C. D. Thurmond, Phys. Rev. B 14, 3551 (1976).
R. B. Fair, in: Semiconductor Silicon 1977, H. R. Huff and E. Sirtl eds. (Electrochemical Society, Princeton 1977) p. 968.
G. D. Watkins, J. R. Troxell, and A. P. Chatterjee, in: Lattice Defects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 16.
S. M. Hu, J. Appl. Phys. 45, 1567 (1974).
S. M. Hu, J. Vac. Sci. Technol. 14, 17 (1977).
E. Sirtl, in: Semiconductor Silicon 1977, H. R. Huff and E. Sirtl eds. (Electrochemical Society, Princeton, 1977) p. 4.
S. I. Tan, B. S. Berry, and W. Frank, in: Ion Implantation in Semiconductors and Other Materials, B. L. Crowder ed. (Plenum Press, New York and London 1973) p. 19.
W. Frank, U. Gösele, and A. Seeger, in: Proceedings of the International Conference on Radiation Physics in Semiconductors and Related Materials (Tbilisi/USSR, September 1979), in the press.
H. J. Mayer, H. Mehrer, and K. Maier, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institute of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 186.
A. K. Jonscher, Principles of Semiconductor Device Operation (Wiley, New York 1960).
L. J. Bernewitz and K. R. Mayer, phys. stat. sol. (a) 16, 579 (1973).
A. J. R. de Kock, Phillips Res. Rep., Suppl. 4, 1 (1973).
H. Föll and B. O. Kolbesen, Appl. Phys. 8, 319 (1975).
P. M. Petroff and A. J. R. de Kock, J. Cryst. Growth 30, 117(1975).
H. Poll, B. O. Kolbesen, and W. Frank, phys. stat. sol. (a) 29, K 83 (1975).
L. C. Kimerling, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p.56.
J. C. Bourgoin and J. W. Corbett, Rad. Effects 36, 157 (1978).
U. Gösele, W. Frank, and A. Seeger, in: Defects and Radiation Effects in Semiconductors 1978, J. H. Albany ed. (Institute of Physics, Bristol and London 1979), Inst. Phys. Conf. Ser. No. 46, p. 538.
A. Seeger and H. Mehrer, in: Vacancies and Interstitials in Metals, A. Seeger, D. Schumacher, W. Schilling, and J. Diehl eds. (North-Holland, Amsterdam 1970) p. 1.
H. Mehrer, J. Nuclear Materials 69/70, 38 (1978).
J. R. Troxell, A. P. Chatterjee, G. D. Watkins, and L. C. Kimerling, Phys. Rev. B 19, 5 336 (1979).
L. C. Kimerling and D. V. Lang, in: Lattice Defects in Semiconductors 1974, F. A. Huntley ed. (Institute of Physics, London and Bristol 1975), Inst. Phys. Conf. Ser. No. 23, page 589.
J. D. Weeks, J. C. Tully, and L. C. Kimerling, Phys. Rev. B. 12, 3286 (1975).
J. C. Bourgoin and J. W. Corbett, Phys. Lett. 38A, 135 (1972).
J. R. Troxell and G. D. Watkins, Phys. Rev. B 22, 921 (1980).
B. J. Masters and E. F. Gorey, J. Appl. Phys. 49, 2717 (1978).
W. M. Lomer, Harwell Report 1540 (AERE, Harwell 1954).
J.G. Dienes and A. C. Damask, J. Appl. Phys. 29, 1713 (1958).
R. Sizmann, J. Nuclear Material 69/70, 386 (1978).
P. Baruch, J. Monnier, B. Blanchard, and C. Castaing, Appl. Phys. Lett. 26, 77 (1975).
P. Baruch, in: Radiation Effects in Semiconductors 1976, N. B. Urli and J. W. Corbett eds. (Institue of Physics, Bristol and London 1977), Inst. Phys. Conf. Ser. No. 31, p. 126 (1977).
W. Akutagawa, H. L. Dunlop, R. Hart, and O. J. Marsh, J. App. Phys. 50, 777 (1979).
P. R. Okamoto and L. E. Renn, J. Nuclear Materials 83, 2 (1979).
U. Gösele and H. Strunk, Appl. Phys. 20, 265 (1979).
F. Seitz, Acta Cryst. 3, 355 (1950).
D. G. Nelson, J. F. Gibbson, and W. S. Johnson, Appl. Phys. Lett. 15, 246 (1969).
K. Gamo, K. Masuda, S. Namba, S. Ishihara, and I. Kimura, Appl. Phys. Lett. 17, 391 (1970).
W. G. Allen, Sol. State Electr. 16, 709 (1973).
D. A. Antoniadis, A. G. Gonzalez, and R. W. Dutton, J. Electrochem. Soc. 127, 2243 (1980).
K. H. Nickolas, Sol. State Electr. 9, 35 (1966).
G. Masetti, S. Solmi, and G. Soncini, Sol. State Electr. 16, 1419 (1973).
G. Masetti, S. Solmi, and G. Soncini, Phil. Mag. 33, 613 (1976).
R. Francis and P. S. Dobson, J. Appl Phys. 50, 280 (1979).
D. A. Antonidis, A. M. Lin, and R. W. Dutton, Appl. Phys. Lett. 33, 1030 (1978).
S. M. Hu, in: Diffusion in Semiconductors, D. Shaw ed. (Plenum Press, London 1973) p. 217.
A. F. W. Willoughby, Rep. Prog. Phys. 41, 1665 (1978).
A. F. W. Willoughby, J. Phys. D 10, 455 (1977).
U. Gösele and W. Frank, in these proceedings.
B. Leroy, J. Appl. Phys. 50, 7996 (1979).
C. L. Claeys, G. J. Declerck, and R. J. van Overstraeten, in: Semiconductor Characterization Techniques, P. A. Barnes and G. A. Rozgonyi eds. (Electrochemical Society, Princeton 1978) p. 366.
W. R. Wilcox and T. J. LaChapelle, J. Appl. Phys. 35, 240 (1964).
W. R. Wilcox, T. J. LaChapelle, and D. H. Forbes, J. Electrochem. Soc. 111, 1377 (1964).
M. J. Hill, M. Lietz, R. Sittig, W. Frank, U. Gösele, and A. Seeger, in: Proceedings of the International Conference on Radiation Physics in Semiconductors and Related Materials (Tbilisi/USSR, September 1979), in the press.
G. J. Sprokel and J. M. Fairfield, J. Electrochem. Soc. 112, 200 (1965).
J. L. Lambert, Wiss. Ber. AEG-Telefunken 45, 153 (1972).
W. C. Dash, J. App. Phys. 31, 2275 (1960).
F. A. Huntley and A. F. W. Willoughby, Solid-State Electronics 13, 1231 (1970).
F. A. Huntley and A. F. W. Willoughby, J. Electrochem. Soc. 120, 414 (1973).
F. A. Huntley and A. F. W. Willoughby, Phil. Mag. 28, 1319 (1973).
F. C. Frank and D. Turnbull, Phys. Rev. 104, 617 (1956).
U. Gösele, W. Frank, and A. Seeger, Appl. Phys. 23, 361 (1980).
A. Seeger, phys. stat. sol. (a) 61, 521 (1980).
M. D. Sturge, Proc. Phys. Soc. (Lond.) 73, 297 (1959).
A. Seeger and W. Frank, to be published.
W. Meyberg, unpublished.
W. M. Bullis, Solid-State Electronics 9, 143 (1966).
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Frank, W., Seeger, A. & Gösele, U. From the Mystery to the Understanding of the Self-Interstitials in Silicon. MRS Online Proceedings Library 2, 31 (1980). https://doi.org/10.1557/PROC-2-31
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DOI: https://doi.org/10.1557/PROC-2-31