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Pulsed Raman Measurements of Phonon Populations: Time Reversal, Correction Factors, and All That

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Abstract

Transient optic phonon populations are measured in crystalline Si as a function of 532 nm laser energy density. The use of a continuously tunable pulsed dye laser as the Raman probe allows us to obtain, under exact experimental conditions, all correction factors necessary to extract the phonon population without the necessity of relying on room temperature or oven-heated conditions. We find the shift of the 520 cm Raman-line to be consistent with the observed Stokes/anti-Stokes ratios indicating a maximum optic phonon temperature of 450 ± 100°C. A discussion is also given of the errors in several recent criticisms of the Raman results.

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References

  1. A. Compaan, H.W. Lo, M.C. Lee and A. Aydinli, Phys. Rev. B26, 1079 (1982).

    Article  Google Scholar 

  2. A. Compaan, A. Aydinli, M.C. Lee and H.W. Lo, in Laser and Electron-Beam Interactions with Solids, B.R. Appleton and G.K. Celler, eds. (Elsevier, New York, 1982), p. 43.

  3. R. Loudon, Proc. R. Soc. London A 275, 218 (1963), W. Hayes and R. Loudon, Scattering of Light by Crystals (Wiley, New York, 1978), p. 31.

    Article  CAS  Google Scholar 

  4. A. Compaan, A.Z. Genack, H.Z. Cummins and M. Washington in Light Scattering in Solids, edited by M. Balkanski, R.C.C. Leite and S.P.S. Porto (Flammarion, Paris, 1975), p. 39.

  5. J.F. Scott, R.C.C. Leite and T.C. Damen, Phys. Rev. 188, 1285 (1969); W. Richter, in Solid State Physics (Vol. 78 of Springer Tracts in Modern Physics, G. Hohler, ed.) Springer-Verlag, Berlin (1976); P.F. Williams and S.P.S. Porto, Phys. Rev. B8, 1782 (1973).

    Article  CAS  Google Scholar 

  6. R.F. Wood, M. Rasolt and G.E. Jellison, Jr., Op.cit. ref. 2, p. 61.

  7. R.F. Wood, D.H. Lowndes, and G.E. Giles, Op.cit. ref. 2, p. 67.

  8. R.F. Wood, D.H. Lowndes, G.E. Jellison and F.A. Modine, Appl. Phys. Lett. 41, 287 (1982).

    Article  CAS  Google Scholar 

  9. H. W. Lo and A. Compaan, Phys. Rev. Lett. 44, 1604 (1980).

    Article  CAS  Google Scholar 

  10. H. W. Lo and A. Compaan, Appl. Phys. Lett. 38, 179 (1981).

    Article  CAS  Google Scholar 

  11. A. Compaan, H.W. Lo, A. Aydinli and M.C. Lee, in Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, Hess and Sigmon, eds. (Elsevier, New York, 1981), p. 151.

    Google Scholar 

  12. G.E. Jellison and F.A. Modine, Appl. Phys. Lett. 41, 180 (1982).

    Article  CAS  Google Scholar 

  13. J.B. Renucci, R.N. Tyte and M. Cardona, Phys. Rev. B11, 3885 (1975).

    Article  Google Scholar 

  14. D. von der Linde and G. Wartman, Appl. Phys. Lett. (to be published, Oct. 1982); D. von der Linde, G. Wartman, and A. Ozols (preceeding paper).

    Google Scholar 

  15. J. Narayan, Op.cit. ref. 2, p. 141.

  16. J. Narayan and J. Fletcher, in Defects in Semiconductors, Narayan and Tan, eds. (North Holland, New York, 1981), p. 431.

  17. J. Narayan, in Microscopy of Semiconducting Materials, 1981, Cullis and Joy, eds. (Institute of Physics Conf. Ser. 60), p. 101.

  18. J. Narayan, J. Fletcher, W.W. White and H. Christie, J. Appl. Phys. 52, 7121 (1981).

    Article  CAS  Google Scholar 

  19. R.J. Nemanich, D.K. Biegelson and W.G. Hawkins (private communication).

  20. M. Balkanski, R.F. Wallis and E. Haro, Physical Review (to be published).

  21. R. Biswas and V. Ambegaokar, Phys. Rev. B26, 1980 (1982).

    Article  Google Scholar 

  22. F. Cerdeira, T. Fjeldly and M. Cardona, Phys. Rev. B8, 4734 (1973).

    Article  Google Scholar 

  23. J.A. Van Vechten, Op. cit. ref. 2, p. 49.

  24. J.M. Liu, H. Kurz and N. Bloembergen, Appl. Phys. Lett. 41, 643 (1982); D. von der Linde and N. Fabricius, Appl. Phys. Lett. (Nov. 15, 1982).

    Article  CAS  Google Scholar 

  25. G.E. Jellison, Jr., D.H. Lowndes, and R.F. Wood (following paper, this conference).

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Acknowledgements

The support of the US Office of Naval Research (contract no. N00014-80-C-0419) for the K.S.U. work is gratefully acknowledged. One of the authors (A.C.) is indebted to the Alexander von Humboldt Foundation for support and to P. Zwicknagel and J. Trodahl for assistance with the Nomarski and micro-Raman work, respectively, at the M.P.I.

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On sabbatical leave fran Kansas State University

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Compaan, A., Lo, H.W., Aydinli, A. et al. Pulsed Raman Measurements of Phonon Populations: Time Reversal, Correction Factors, and All That. MRS Online Proceedings Library 13, 23–33 (1982). https://doi.org/10.1557/PROC-13-23

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  • DOI: https://doi.org/10.1557/PROC-13-23

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