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Strong Exciton Polariton Dispersion in Multimode GaN Microcavity

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Abstract

We report the experimental observation of a very strong cavity polariton dispersion in a multi-axial mode GaN microcavity. The linewidth of photoluminescent (PL) spectrum covers a few cavity axial modes. The resonant photoluminescent peaks have a strong dispersion. The frequency spacing between adjacent peaks decreases by almost a factor of five from 470nm to 370nm. The strong dispersion can be well described by cavity polariton dispersion, but not by the dispersion of the refractive index of GaN. The measured exciton-photon interaction constant is 260 meV. It is an order of magnitude higher than the typically reported values for GaN microcavities

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Acknowledgments

The authors would like to acknowledge the support by the National Science Council of Taiwan under Contract No. NSC 97-2112-M-001-027-MY3.

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Authors and Affiliations

  1. Research Center for Applied Sciences, Academia Sinica, Taipei, 11529, Taiwan

    Y.-J. Cheng & S.-H. Hsu

  2. Department of Photonics and Institute of Electro-Optical Engineering, National Chiao Tung University, 1001 TA Hsueh Rd., Hsinchu, 300, Taiwan

    M.C. Liu, Y.-J. Cheng, H. C. Kuo, T.C. Lu & S.-C. Wang

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  1. M.C. Liu
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  2. Y.-J. Cheng
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  3. S.-H. Hsu
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  4. H. C. Kuo
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  5. T.C. Lu
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  6. S.-C. Wang
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Liu, M., Cheng, YJ., Hsu, SH. et al. Strong Exciton Polariton Dispersion in Multimode GaN Microcavity. MRS Online Proceedings Library 1182, 47–51 (2009). https://doi.org/10.1557/PROC-1182-EE13-03

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  • DOI: https://doi.org/10.1557/PROC-1182-EE13-03

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