SpringerLink
Log in

A device for free-carrier recombination lifetime measurements

  • General Experimental Techniques
  • Published:
Instruments and Experimental Techniques Aims and scope Submit manuscript

Abstract

The design of a microwave system, the user interface, and the basic characteristics of noncontact equipment for measuring the recombination lifetime of free charge carriers in semiconductor materials by the photoconductivity-decay method are described. The features of the microwave-system design eliminate the need for a microwave circulator and other expensive elements of the systems without a loss in the equipment sensitivity. This substantially simplifies the design and provides automated measurements of the free-carrier lifetime in silicon single crystals in a range of 0.2 μs to tens of milliseconds. The upper measurement limit is determined by the geometrical dimensions of a sample and the surface treatment quality. The results of measuring the photoconductivity relaxation time in reference single-crystal silicon samples are presented.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. Batavin, V.V., Kontsevoi, Yu.A., and Fedorovich, Yu.V., Izmerenie parametrov poluprovodnikovykh materialov i struktur (Measurement of the Parameters of Semiconductor Materials and Structures), Moscow: Radio i Svyaz’, 1985.

    Google Scholar 

  2. Runyan, W.R. and Shaffner, T.J., Semiconductor Measurements and Instrumentation, New York: McGraw-Hill, 1997.

    Google Scholar 

  3. Khanna, V.K., Progress Quant. Electron., 2005, vol. 29, no. 2, p. 59. doi 10.1016/j.pquantelec.2005.01.002

    Article  ADS  MathSciNet  Google Scholar 

  4. Gaubas, E., Vanhellemont, J., Sinoen, E., Romandic, I., Geens, W., and Clauws, P., Phys. B–Condens. Matter, 2007, vol. 401, p. 222. doi 10.1016/j.physb.2007.08.151

    Article  ADS  Google Scholar 

  5. Goryunov, N.N., Kobeleva, S.P., Charykov, N.A., Lukashov, N.V., and Slesarev, V.N., Zavod. Lab., Diagn. Mater., 2004, vol. 70, no. 5, p. 27.

    Google Scholar 

  6. SEMI M F1535-0707, SEMI Annual Book. 2007, p. 8274.

  7. SEMI M F28-0707, SEMI Annual Book. 2007, p. 7762.

  8. Borodovskij, P.A. and Buldygin, A.F., Prib. Tekh. Eksp., 1995, no. 6, p. 799.

    Google Scholar 

  9. Akhmanaev, V.B., Lisyuk, Yu.V., Medvedev, Yu.V., and Petrov, A.S., Russ. Phys. J., 1983, vol. 26, no. 6, p. 569. doi 10.1007/BF00891934

    Google Scholar 

  10. www.fractal.com.ru

  11. Anfimov, I.M., Kobeleva, S.P., and Schemerov, I.V., Inorgan. Mater., 2015, vol. 51, no. 15, p. 1447. doi 10.1134/S0020168515150029

    Article  Google Scholar 

  12. Yurchuk, S.Yu. and Kobeleva, S.P., Svidetel’stvo o gos. registratsii programmy dlya EVM no. 2013612971 (Certificate on State Registration of a Program for Computers, no. 2013612971), 2013.

    Google Scholar 

  13. SEMI MF 391-1106, SEMI Annual Book, 2007, p. 7884.

Download references

Author information

Authors and Affiliations

  1. National University of Science and Technology MISiS, Leninskii pr. 4, Moscow, 119049, Russia

    S. P. Kobeleva, I. M. Anfimov & I. V. Schemerov

Authors
  1. S. P. Kobeleva
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. I. M. Anfimov
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. I. V. Schemerov
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to S. P. Kobeleva.

Additional information

Original Russian Text © S.P. Kobeleva, I.M. Anfimov, I.V. Schemerov, 2016, published in Pribory i Tekhnika Eksperimenta, 2016, No. 3, pp. 91–95.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Kobeleva, S.P., Anfimov, I.M. & Schemerov, I.V. A device for free-carrier recombination lifetime measurements. Instrum Exp Tech 59, 420–424 (2016). https://doi.org/10.1134/S0020441216030064

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1134/S0020441216030064

Search

Navigation