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Epstein, J.S., Post, D. & Smith, C.W. Three-dimensional Photoelastic Measurements with Very Thin Slices. Exp Tech 8, 34–37 (1984). https://doi.org/10.1111/j.1747-1567.1984.tb01861.x
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DOI: https://doi.org/10.1111/j.1747-1567.1984.tb01861.x