Log in

Measurement of Thermal Conductivity of TiO2 Thin Films Using 3ω Method

  • Published:
International Journal of Thermophysics Aims and scope Submit manuscript

Abstract

TiO2 film has been used in many industrial components such as laser filters, protection mirrors, chemical sensors, and optical catalysts. Therefore, the thermal properties of TiO2 thin films are important in, e.g., reducing the thermal conductivity of ceramic coatings in gas turbines and increasing the laser damage threshold of antireflection coatings. The thermal conductivity of four kinds of TiO2 thin films, prepared by dc magnetron sputtering, was measured using the 3ω method in the temperature range from 80 K to room temperature. The results showed that the thermal conductivity of TiO2 thin films strongly depends on the thickness and the microstructure of the films. The films with smaller grain size and thinner thickness have smaller thermal conductivities.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price includes VAT (Germany)

Instant access to the full article PDF.

Similar content being viewed by others

REFERENCES

  1. A. H. Guenther and J. K. Mclver, Thin Solid Films 163:203(1988).

    Google Scholar 

  2. D. Ristau and J. Ebert, Appl. Opt. 25:4571(1986).

    Google Scholar 

  3. J. C. Lambropoulos, M. R. Jolly, C. A. Amsden, S. E. Gilman, M. J. Sinicropi, D. Diakomihalis, and S. D. Jacobs, J. Appl. Phys. 66:4230(1989).

    Google Scholar 

  4. C. H. Henager, Jr. and W. T. Pawlewicz, Appl. Opt. 32:91(1993).

    Google Scholar 

  5. M. Okuda and S. Ohkubo, Thin Solid Films 213:176(1992).

    Google Scholar 

  6. D. G. Cahill, Rev. Sci. Instrum. 61:802(1990).

    Google Scholar 

  7. D. G. Cahill, H. E. Fischer, T. Klitsner, E. T. Swartz, and R. O. Pohl, J. Vac. Sci. Technol. A 7:1259(1989).

    Google Scholar 

  8. H. S. Carslow and J. C. Jaeger, Conduction of Heat in Solids (Oxford University Press, Oxford, 1959), p. 193.

    Google Scholar 

  9. S. M. Lee and D. G. Cahill, J. Appl. Phys. 81:2590(1997).

    Google Scholar 

  10. S. M. Lee and D. G. Cahill, Phys. Rev. B 52:253(1995).

    Google Scholar 

  11. Y. S. Touloukian, R. W. Powell, C. Y. Ho, and M. C. Nicolaou, Thermophysical Properties of Matter, Vol. 2 (Plenum, New York, 1973), p. 203.

    Google Scholar 

  12. E. T. Swartz and R. O. Pohl, Appl. Phys. Lett. 51:2200(1987).

    Google Scholar 

  13. S. M. Lee and D. G. Cahill, J. Appl. Phys. 81:2590(1997).

    Google Scholar 

  14. T. Yamane, N. Nagai, S. Katayama, and M. Todoki, J. Appl. Phys. 91:9772(2002).

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to S. W. Kim.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Kim, D.J., Kim, D.S., Cho, S. et al. Measurement of Thermal Conductivity of TiO2 Thin Films Using 3ω Method. International Journal of Thermophysics 25, 281–289 (2004). https://doi.org/10.1023/B:IJOT.0000022340.65615.22

Download citation

  • Issue Date:

  • DOI: https://doi.org/10.1023/B:IJOT.0000022340.65615.22

Navigation