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Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films

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Abstract

To experimentally determine the mass absorption coefficient (μ) of a sp3-carbon (C) atom in the soft X-ray region, soft X-ray absorption spectra (XAS) in the 200–800 eV and C K regions of 200-nm-thick self-standing polyethylene (PE) films were measured in the transmission and total electron yield (TEY) modes. PE films were prepared by a spin-coating method. Their experimentally measured thickness and density are 200 nm and 0.920 g/cm3, respectively. Soft X-ray absorption measurements were performed in beamline BL-6.3.2 at the Advanced Light Source. Although surface oxygen can be slightly observed in the O K and C K regions in TEY-XAS, it cannot be observed in absorbance-XAS. The absorbance-XAS profiles agree well with the calculated profiles, except in the C K threshold. Hence, it can be confirmed that the absorption-XAS measurements are achieved. From the absorbance, μ of sp3-C in PE is 7 × 104 cm2/g near 288 eV and 294 eV.

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Acknowledgements

The authors express their sincerest gratitude to Dr. Eric M. Gullikson (Center for X-Ray Optics, Lawrence Berkeley National Laboratory) for his support in using BL-6.3.2/ALS. This work was supported by a Grant-in-Aid from the Ministry of Education, Culture, Sports, Science, and Technology of Japan under contract No. 18H02007.

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  1. Graduate School of Engineering, University of Hyogo, 2167 Shosha, Himeji, Hyogo, 671-2201, Japan

    Yasuji Muramatsu & Yuya Matsumoto

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  1. Yasuji Muramatsu
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  2. Yuya Matsumoto
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Correspondence to Yasuji Muramatsu.

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Muramatsu, Y., Matsumoto, Y. Mass absorption coefficient in the 200–800 eV region of sp3 carbon atoms measured using self-standing polyethylene thin films. ANAL. SCI. 39, 1089–1096 (2023). https://doi.org/10.1007/s44211-023-00318-4

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